Results 211 to 216 of about 852,793 (216)
Some of the next articles are maybe not open access.

Single Event Upset Measurements of Gaas E-JFET RAMS

IEEE Transactions on Nuclear Science, 1983
P Shapiro, A B Campbell, R Zuleeg
exaly  

Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

IEEE Transactions on Nuclear Science, 2000
P E Dodd, D S Walsh, J R Schwank
exaly  

LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices

IEEE Transactions on Nuclear Science
Arijit Sengupta   +2 more
exaly  

Home - About - Disclaimer - Privacy