Results 211 to 216 of about 852,793 (216)
Some of the next articles are maybe not open access.
Single Event Upset Measurements of Gaas E-JFET RAMS
IEEE Transactions on Nuclear Science, 1983P Shapiro, A B Campbell, R Zuleeg
exaly
Single-event upset and snapback in silicon-on-insulator devices and integrated circuits
IEEE Transactions on Nuclear Science, 2000P E Dodd, D S Walsh, J R Schwank
exaly
An Updated Perspective of Single Event Gate Rupture and Single Event Burnout in Power MOSFETs
IEEE Transactions on Nuclear Science, 2013Jeffrey L Titus
exaly
Predictors of outcome after single-event multilevel surgery in children with cerebral palsy
Bone and Joint Journal, 2016exaly

