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12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to be taken into account. We can also observe a trend in the results of soft error tests.
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Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to be taken into account. We can also observe a trend in the results of soft error tests.
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2020
Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010
This paper presents a construction of a flip-flop (FF) that works as a soft error tolerant FF in system operations and as a BILBO (Built-In Logic Block Observer) FF in manufacturing testing. The construction of the proposed FF is based on that of an existing soft error tolerant FF, namely a BISER (Built-In Soft Error Resilience) FF.
Kazuteru Namba, Hideo Ito
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This paper presents a construction of a flip-flop (FF) that works as a soft error tolerant FF in system operations and as a BILBO (Built-In Logic Block Observer) FF in manufacturing testing. The construction of the proposed FF is based on that of an existing soft error tolerant FF, namely a BISER (Built-In Soft Error Resilience) FF.
Kazuteru Namba, Hideo Ito
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The concern for soft errors is not overblown
IEEE International Conference on Test, 2005., 2006Single event upsets in logic paths are an emerging concern for computing systems built in advanced CMOS technologies. Upset rates for latches used in sequential circuits are increasing, and combinatorial circuit elements will also become a factor for future technology nodes.
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SIMD-based soft error detection
Proceedings of the ACM International Conference on Computing Frontiers, 2016Soft error rates in processors have been increasing with decreasing feature size and larger chips. Software-only solutions have been proposed to deal with this problem, for instance via instruction duplication. However, this leads to significant overheads in performance and energy.
Zhi Chen 0001 +2 more
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Managing Soft-Errors in Transactional Systems
2014 IEEE International Parallel & Distributed Processing Symposium Workshops, 2014Multicore architectures are becoming increasingly prone to soft-errors – i.e., transient faults caused by external physical phenomena such as electric noise and cosmic particle strikes. With increasing core counts, the soft-error rate is growing due to the accelerating transistor density on chips.
Mohamed Mohamedin +2 more
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Effects of Soft Error to System Reliability
2011 IEEE Workshops of International Conference on Advanced Information Networking and Applications, 2011Soft errors on hardware could affect the reliability of computer system. To estimate system reliability, it is important to know the effects of soft errors to system reliability. This paper explores the effects of soft errors to computer system reliability. We propose a new approach to measure system reliability for soft error factor.
Lei Xiong, Qingping Tan, Jianjun Xu
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An Experimental Study of Soft Errors in Microprocessors
IEEE Micro, 2005The issue of soft errors is an important emerging concern in the design and implementation of future microprocessors. The authors examine the impact of soft errors on two different microarchitectures: a DLX processor for embedded applications and a high-performance alpha processor.
Giacinto Paolo Saggese +4 more
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A dynamic approach to tolerate soft errors
Cluster Computing, 2012Dynamic implementation for software-based soft error tolerance method which can protect more types of codes can cover more soft errors. This paper explores soft error tolerance with dynamic software-based method. We propose a new dynamic software-based approach to tolerate soft errors.
Lei Xiong, Qingping Tan
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Modeling the Propagation of Soft Errors in Programs
Proceedings of the 2nd International Conference on Computer Science and Software Engineering, 2019Due to the continuous growth of transistors in processors, the cloud computing paradigm and increasingly complex environment, soft errors, which are a category of typical transient errors, have become an urgent challenge in ground-level systems. To handle these errors, making clear the error propagation is the key step.
Lixing Xue, Zhan Zhang, Decheng Zou
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