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2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010
This paper presents a construction of a flip-flop (FF) that works as a soft error tolerant FF in system operations and as a BILBO (Built-In Logic Block Observer) FF in manufacturing testing. The construction of the proposed FF is based on that of an existing soft error tolerant FF, namely a BISER (Built-In Soft Error Resilience) FF.
Kazuteru Namba, Hideo Ito
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This paper presents a construction of a flip-flop (FF) that works as a soft error tolerant FF in system operations and as a BILBO (Built-In Logic Block Observer) FF in manufacturing testing. The construction of the proposed FF is based on that of an existing soft error tolerant FF, namely a BISER (Built-In Soft Error Resilience) FF.
Kazuteru Namba, Hideo Ito
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An Experimental Study of Soft Errors in Microprocessors
IEEE Micro, 2005The issue of soft errors is an important emerging concern in the design and implementation of future microprocessors. The authors examine the impact of soft errors on two different microarchitectures: a DLX processor for embedded applications and a high-performance alpha processor.
Giacinto Paolo Saggese +4 more
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Soft Error Hardening for Asynchronous Circuits
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007As the devices are scaling down, the combinational logic will become susceptible to soft errors. The conventional soft error tolerant methods for soft errors on combinational logic do not provide enough high soft error tolerant capability with reasonably small performance penalty.
Weidong Kuang +2 more
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Detecting soft errors by redirection classification
Proceedings of the 18th international conference on World wide web, 2009A soft error redirection is a URL redirection to a page that returns the HTTP status code 200 (OK) but has actually no relevant content to the client request. Since such redirections degrade the performance of web search engines in many ways, it is highly desirable to remove as many of them as possible.
Taehyung Lee 0002 +4 more
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Design for Resilience to Soft Errors and Variations
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007This paper presents adaptive variation-and-error-resilient agent (AVERA), an approach to address the challenge of designing reliable systems in the presence of soft errors and variations. AVERA extends our previous built-in soft error resilience (BISER) approach by adding additional capabilities to support process variation diagnosis, degradation ...
Ming Zhang 0017 +5 more
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Soft Errors Susceptibility of Virtualization Servers
2017 IEEE 22nd Pacific Rim International Symposium on Dependable Computing (PRDC), 2017Virtualization is essential in supporting today's information infrastructure, and in particular the Cloud Computing area. However, the move to a virtualized architecture implies the addition of a new single point of failure: the hypervisor. Attempts to characterize and compare the susceptibility of systems (including virtualized systems) are often ...
Frederico Cerveira +2 more
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Modeling Soft-Error Propagation in Programs
2018 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2018As technology scales to lower feature sizes, devices become more susceptible to soft errors. Soft errors can lead to silent data corruptions (SDCs), seriously compromising the reliability of a system. Traditional hardware-only techniques to avoid SDCs are energy hungry, and hence not suitable for commodity systems.
Guanpeng Li +4 more
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Soft errors induced by alpha particles
IEEE Transactions on Reliability, 1996Soft errors induced by alpha particles can be a reliability concern for microelectronics, especially semiconductor memory devices packaged in ceramic. In dynamic random-access memory devices (DRAM), the data are stored as the presence or absence of minority carrier charges on storage capacitors.
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Combinational Logic Soft Error Correction
2006 IEEE International Test Conference, 2006We present two techniques for correcting radiation-induced soft errors in combinational logic ? Error Correction using Duplication, and Error Correction using Time-Shifted Outputs. Simulation results show that both techniques reduce combinational logic soft error rate by more than an order of magnitude.
Subhasish Mitra +5 more
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The Soft Error Problem: An Architectural Perspective
11th International Symposium on High-Performance Computer Architecture, 2005Radiation-induced soft errors have emerged as a key challenge in computer system design. If the industry is to continue to provide customers with the level of reliability they expect, microprocessor architects must address this challenge directly. This effort has two parts.
Shubhendu S. Mukherjee +2 more
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