Results 281 to 290 of about 240,975 (314)
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Soft Error Issues with Scaling Technologies
2012 IEEE 21st Asian Test Symposium, 2012As transistor geometry shrinks, the erroneous and spurious charge from a particle strike tends to be shared by multiple nodes and causes multiple nodes upset. Such SEU mechanism invalidates the hardening principle of protecting a single node in relatively larger technologies. SEU needs to be accordingly understood and evaluated.
Sanghyeon Baeg +5 more
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Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements
2023 International Conference on IC Design and Technology (ICICDT), 2023Haruto Sugisaki +4 more
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Soft Errors in Advanced Computer Systems
IEEE Design and Test of Computers, 2005As the dimensions and operating voltages of computer electronics shrink to satisfy consumers' insatiable demand for higher density, greater functionality, and lower power consumption, sensitivity to radiation increases dramatically. In terrestrial applications, the predominant radiation issue is the soft error, whereby a single radiation event causes a
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Featherweight Soft Error Resilience for GPUs
2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO), 2022Yida Zhang, Changhee Jung
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Improving the Soft-error Tolerability of a Soft-core Processor on
Journal of Next Generation Information Technology, 2011Yoshihiro Ichinomiya +4 more
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A Survey on Multithreading Alternatives for Soft Error Fault Tolerance
ACM Computing Surveys, 2020Isil Oz, Sanem Arslan
exaly
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications
Journal of Electronic Testing: Theory and Applications (JETTA), 2020Ambika Prasad Shāh +2 more
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Soft Error Protection Techniques
2008 14th IEEE International On-Line Testing Symposium, 2008openaire +1 more source

