Results 311 to 314 of about 240,975 (314)
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ReStore: Symptom-Based Soft Error Detection in Microprocessors

IEEE Transactions on Dependable and Secure Computing, 2006
exaly  

Early Execution for Soft Error Detection

2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID)
Raj Kumar Choudhary   +2 more
openaire   +1 more source

Cosmic ray induced soft error rate in VLSI circuits

IEEE Electron Device Letters, 1983
exaly  

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