Results 301 to 310 of about 1,194,614 (343)

Combinational Logic Soft Error Correction

2006 IEEE International Test Conference, 2006
We present two techniques for correcting radiation-induced soft errors in combinational logic ? Error Correction using Duplication, and Error Correction using Time-Shifted Outputs. Simulation results show that both techniques reduce combinational logic soft error rate by more than an order of magnitude.
Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran Gill, Kee Sup Kim   +5 more
openaire   +1 more source

Design for soft error mitigation

IEEE Transactions on Device and Materials Reliability, 2005
In nanometric technologies, circuits are increasingly sensitive to various kinds of perturbations. Soft errors, a concern for space applications in the past, became a reliability issue at ground level. Alpha particles and atmospheric neutrons induce single-event upsets (SEU), affecting memory cells, latches, and flip-flops, and single-event transients (
openaire   +2 more sources

Trend in DRAM Soft Errors

12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to be taken into account. We can also observe a trend in the results of soft error tests.
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Soft error assessments for servers

2010 IEEE International Reliability Physics Symposium, 2010
In order to assess the soft error rate (SER) of a server, it is important to not only quantify the soft error contribution of the individual semiconductor components, but also to account for derating and for SER mitigation like hardening and shielding. Derating describes the fact that not every soft error has an impact.
K Paul Muller, Pia N. Sanda
openaire   +1 more source

Single Event Soft Error Mechanisms

2016
Researchers mostly considered Single Event Transients (SET) as the main cause of radiation induced transient failure of combinatorial circuits. However, recent research has reported new mechanisms for such transient failures such as radiation induced soft delays, clock jitter and race, single event crosstalk noise, delay and speed up effects.
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Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements

2023 International Conference on IC Design and Technology (ICICDT), 2023
Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi   +4 more
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Soft Error in Our Life

European Journal of Science, Innovation and Technology, 2022
A soft error was not recognized as a major problem until the 1970s. Now it is confirmed that a soft error is caused by alpha rays radiating. The small cosmic ray-induced neutrons can cause a soft error served as the electric charge contained in memory chip. A memory chip is a type of integrated circuit.
openaire   +1 more source

Soft Error Assessment Methodology

2023
Geancarlo Abich, Luciano Ost, Ricardo Reis   +2 more
openaire   +1 more source

Soft Errors on Digital Components

2005
Data from many application fields confirm that digital components implemented in modern Very Deep Sub Micron technologies are more and more susceptible to Soft Errors, i.e. bit-flip in memories or in sequential elements. It is an emerging reliability problem that cannot be furthermore ignored and requires actions to be carried out at the various steps ...
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Circuit-Level Soft-Error Mitigation

2010
In nanometric technologies, circuits are increasingly sensitive to various kinds of perturbations. Soft errors, a concern in the past for space applications, became a reliability issue at ground level. Alpha particles and atmospheric neutrons induce single-event upsets (SEUs) affecting memory cells, latches, and flip-flops, and single-event transients (
openaire   +2 more sources