Results 211 to 220 of about 114,741 (276)
Some of the next articles are maybe not open access.
Soft error vulnerability aware process variation mitigation
2009 IEEE 15th International Symposium on High Performance Computer Architecture, 2009As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior studies have shown that chip operating frequency and leakage power can have large variations due to fluctuations in transistor gate length and sub-threshold voltage. In this work,
Xin Fu, Tao Li, Jose A. B. Fortes
openaire +1 more source
Using value similarity of registers for soft error mitigation
2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015Soft errors caused by the cosmic particles or the radiation from the packaging material of the integrated circuits are an increasingly important design problem. With the shrinking feature sizes, the datapath components of the out-of-order superscalar pipeline are becoming more prone to soft errors. Being the major data holding component in contemporary
Eker, Abulaziz, Ergin, Oğuz
openaire +2 more sources
Flexible Soft Error Mitigation Strategy for Memories in Mixed-Critical Systems
2019 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW), 2019As memories are becoming a ubiquitous and indispensable part of electronic devices across all industrial domains, the importance of their reliability and fault-tolerance increases.
Amer Kajmakovic +4 more
semanticscholar +1 more source
Soft Error and Soft Delay Mitigation Using Dynamic Threshold Technique
IEEE Transactions on Nuclear Science, 2010When designers try to address increasing power consumption reduction via optimizations, they need to be aware of the impact on single event robustness. In this work, we examined dynamic threshold MOS-based (DTMOS) schemes for their soft error and soft delay tolerance.
Selahattin Sayil, Nareshkumar B. Patel
openaire +1 more source
Reduced overhead soft error mitigation using error control coding techniques
2011 IEEE 17th International On-Line Testing Symposium, 2011Soft errors are one of the biggest reliability challenges for present day electronic devices. With technology scaling, the contribution of soft errors to overall device failure is on the rise and it is becoming the dominant reliability failure mechanism. Several techniques exist for the detection and correction of soft errors.
V Prasanth +2 more
openaire +1 more source
Software-Level Soft-Error Mitigation Techniques
2010Several application domains exist, where the effects of Soft Errors on processor-based systems cannot be faced by acting on the hardware (either by changing the technology, or the components, or the architecture, or whatever else). In these cases, an attractive solution lies in just modifying the software: the ability to detect and possibly correct ...
REBAUDENGO, Maurizio +2 more
openaire +1 more source
A New Mitigation Approach for Soft Errors in Embedded Processors
IEEE Transactions on Nuclear Science, 2007Embedded processors, like for example processor macros inside modern FPGAs, are becoming widely used in many applications. As soon as these devices are deployed in radioactive environments, designers need hardening solutions to mitigate radiation-induced errors.
ABATE, FRANCESCO +2 more
openaire +3 more sources
Design for soft error mitigation
IEEE Transactions on Device and Materials Reliability, 2005In nanometric technologies, circuits are increasingly sensitive to various kinds of perturbations. Soft errors, a concern for space applications in the past, became a reliability issue at ground level. Alpha particles and atmospheric neutrons induce single-event upsets (SEU), affecting memory cells, latches, and flip-flops, and single-event transients (
openaire +2 more sources
Mitigating Soft Errors in System-on-Chip Design
2008 The 9th International Conference for Young Computer Scientists, 2008With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation scaling. Technology trends such as transistor downsizing, use of new materials and high performance computer architecture continue to increase the sensitivity of systems to soft errors.
Hai Yu, Fan Xiaoya
openaire +1 more source
Compiler-Directed Soft Error Mitigation for Embedded Systems
IEEE Transactions on Dependable and Secure Computing, 2012The protection of processor-based systems to mitigate the harmful effect of transient faults (soft errors) is gaining importance as technology shrinks. At the same time, for large segments of embedded markets, parameters like cost and performance continue to be as important as reliability.
A. Martinez-Alvarez +5 more
openaire +1 more source