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Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis, 2012
A recent report from the ITRS identifies soft errors, as one of the most important reliability challenges for the coming decades. Soft errors are transient errors caused by several effects e.g., voltage fluctuations, wire-cross talks, and cosmic particle strikes; and manifest as a temporary switch of the logic value of a transistor.
Kyoungwoo Lee +2 more
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A recent report from the ITRS identifies soft errors, as one of the most important reliability challenges for the coming decades. Soft errors are transient errors caused by several effects e.g., voltage fluctuations, wire-cross talks, and cosmic particle strikes; and manifest as a temporary switch of the logic value of a transistor.
Kyoungwoo Lee +2 more
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2021
Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses.
Alexandra Zimpeck +3 more
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Soft errors are transient events with a short time interval induced by energetic particles coming from terrestrial and space radiations. Radiation-induced soft errors may cause critical failures in system behavior, leading to financial or human life losses.
Alexandra Zimpeck +3 more
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2020
Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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Embedded systems reliability is a wide subject and complex subject. For this reason, chapter two explores the main reliability challenges in electronic-based systems: Process Variability, Permanent faults, and Transient faults. Moreover, this chapter provides a brief introduction to Radiation-Induced Soft Errors.
Felipe Rocha da Rosa +2 more
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CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
Journal of Electronic Testing, 2013Due to the continuous technology scaling, soft error becomes a major reliability issue at nanoscale technologies. Single or multiple event transients at low levels can result in multiple correlated bit flips at logic or higher abstraction levels. Addressing this correlation is essential for accurate low-level soft error rate estimation, and more ...
Chen, L., Ebrahimi, M., Tahoori, M. B.
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Introduction: Soft Error Modeling
2020Reliability of the VLSI circuits has become an important issue in the current years. Among these noise sources, radiation-induced soft errors in commercial nanometer CMOS technologies have become a growing concern. This chapter provides introductions to soft error issue and soft error modeling procedure.
Behnam Ghavami, Mohsen Raji
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Extensive Soft Error Evaluation
2020This chapter utilizes the power of the fault injection framework previously detailed to investigate soft error reliability from two distinct approaches: (1) the impact of different software stacks including OS, parallelization library, ISA using more than 50 distinct embedded and high-performance applications with up to 85 billion of object code ...
Felipe Rocha da Rosa +2 more
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Soft errors: is the concern for soft-errors overblown?
IEEE International Conference on Test, 2005., 2006Cosmic ray particles have the ability to either toggle the state of memory elements or create unwanted glitches in combinational logic that may be latched by memory elements. As supply voltages reduce and feature sizes become smaller in future technologies, soft error tolerance is considered a significant challenge for designing future electronic ...
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Soft Error Mitigation in Soft-Core Processors
2016This chapter aims to present different approaches and techniques available in literature regarding the fault mitigation on soft-core processors, with an especial emphasis on those ones involving hardware/software hybrid-based solutions.
Antonio Martínez-Álvarez +2 more
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A soft error rate analysis (SERA) methodology
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004., 2005We present a soft error rate analysis (SERA) methodology for combinational and memory circuits. SERA is based on a modeling and analysis-based approach that employs a judicious mix of probability theory, circuit simulation, graph theory and fault simulation.
M. Zhang, N.R. Shanbhag
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