Results 101 to 110 of about 164,512 (299)
Secondary‐ion mass spectrometry methodology and surface chemistry of mixed oxide electrodes: Modifications induced by noble‐metal content [PDF]
Mixed-oxide coatings are extensively used in the electrochemical industry. Secondary-ion mass spectrometric data confirm that technological research can indeed find a new way of controlling precursors, synthesis conditions, purity of coatings and ...
A. BARBIERI +9 more
core +1 more source
Fully additive vertical organic electrochemical transistors (vOECTs) with channel‐length of 226 nm on a 50 µm compostable substrate achieve >106 current modulation and ∼36 mS transconductance. Ion‐selective integration enables 1.1 mA dec−1 sensitivity and 36 µm detection limit, highlighting a scalable platform for sustainable electronics and ...
Giulia Frusconi +3 more
wiley +1 more source
Advanced electronics for fourier-transform ion cyclotron resonance mass spectrometry [PDF]
With the development of mass spectrometry (MS) instruments starting in the late 19th century, more and more research emphasis has been put on MS related subjects, especially the instrumentation and its applications.
Lin, Tzu-Yung
core
Simulation and Engineering Design of a Secondary Quadrupole Ion Transmission System
In this study, the secondary quadrupole ion transmission system was investigated, focusing on its design and optimization using computational fluid dynamics (CFD) and ion optics simulations.
Xin ZHANG +8 more
doaj +1 more source
An intrinsic photoactive star‐shaped zinc phtalocyanine‐poly(L‐glutamic acid) (ZnPc‐PGA) nanoplatform for multimodal glioblastoma (GBM) therapy and brain‐targeted elivery. A ZnPc‐PGA‐based multifunctional theranostic nanocarrier platform enables image‐guided, multimodal GBM therapy. ZnPc‐PGA nanocarriers support the integration of fluorescence imaging,
Amina Benaicha‐Fernández +14 more
wiley +1 more source
Combined Secondary Ion Mass Spectrometry Depth Profiling and Focused Ion Beam Analysis of Cu Films Electrodeposited under Oscillatory Conditions [PDF]
The recrystallization behavior of Cu films electrodeposited under oscillatory conditions in the presence of plating additives was studied by means of secondary ion mass spectrometry (SIMS) and focused ion beam analysis.
Stricker, Florian Ulrich +4 more
core +1 more source
Ferroelectric tunnel junction devices based on epitaxial undoped ferroelectric HfO2 films demonstrate stable switching endurance of over 106 switching cycles, low write voltages of ±3 V, 16 measured resistance states, and neuromorphic capability.
Markus Hellenbrand +13 more
wiley +1 more source
Development of correlated FIB-ToF-SIMS and SEM-AM methods for the search for, and characterisation of, enriched uranium particles [PDF]
As part of a global initiative to detect and monitor uranium use in nuclear facilities, the International Atomic Energy Agency (IAEA) collects environmental samples from various countries and analyses them for the presence of man-modified uranium and ...
Rickard William +2 more
doaj +1 more source
Significant nanoscale oxygen diffusion coefficient variations are measured in ferroelectric hafnium zirconium oxide films with grain boundaries and electrode interfaces exhibiting values 104 times larger than the grain cores. Overall coefficients are 10X larger for films prepared with metal nitride electrodes compared to refractory metals. New insights
Liron Shvilberg +6 more
wiley +1 more source
Time-of-flight secondary ion mass spectrometric analysis of the interface between bone and titanium implants. [PDF]
Implant healing into bone tissue is a process where the mature bone grows towards and eventually fuses with the implant. In this study we investigated implant healing during 4 weeks with focus on the implant-tissue interface.
Eriksson, Cecilia +4 more
core +1 more source

