Results 141 to 150 of about 3,818 (150)

Spectroscopic Ellipsometry Studies of n-i-p Hydrogenated Amorphous Silicon Based Photovoltaic Devices

Materials, 2016
Nikolas Podraza, Maxwell Junda, Laxmi Karki Gautam   +2 more
exaly  

Spectroscopic Infrared Ellipsometry

2005
openaire   +1 more source

Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 2000
Devanesan Mangalaraj, Karuppanan Senthil, Sa K Narayandass   +2 more
exaly  

Temperature dependence of the optical functions of amorphous silicon-based materials: application to in situ temperature measurements by spectroscopic ellipsometry

Thin Solid Films, 2004
Veinardi Suendo
exaly  

Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films

Synthetic Metals, 2003
Donato Colangiuli, Francesco Babudri, Maria Losurdo   +2 more
exaly  

Spectroscopic ellipsometry on graphene

2010
Weber, J.W., Sanden, van de, M.C.M.
openaire   +1 more source

Multi-analyzer angle spectroscopic ellipsometry

2015
KWAK HINDONG, DIXON WARD, POSLAVSKY LEONID, KAACK TORSTEN   +3 more
openaire   +2 more sources

Spectroscopic ellipsometry measurements of thin metal films

Surface and Interface Analysis, 2000
exaly  

Characterization of semiconductors by spectroscopic ellipsometry

Mathias Schubert, Alyssa Mock, Megan Stokey, Viktor Rindert, Nerijus Armakavicius, Vanya Darakchieva   +5 more
openaire   +1 more source

Introduction to Spectroscopic Ellipsometry

exaly