Ion screening in CF4 plasma reduces CFx+ ion flux while maintaining radical fluxes, suppressing fluorocarbon polymer accumulation. This enables smooth SiGe etching with selectivity up to 30:1 in multilayer stacks. ABSTRACT Selective etching of Si0.7Ge0.3 was investigated in CF4 inductively coupled plasma using an ion‐screening approach to decouple ion ...
Joosung Kang +6 more
wiley +1 more source
Spectroscopic Ellipsometry and Correlated Studies of AlGaN-GaN HEMTs Prepared by MOCVD. [PDF]
Yang Y +10 more
europepmc +1 more source
Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition. [PDF]
Bohórquez C +5 more
europepmc +1 more source
Enhancing Charge Transport and Extraction in Ta3N5 Photoanodes Via Ti Doping and TiN Contact Layers
Ta3N5${\rm Ta}_3{\rm N}_{5}$ is a promising photoanode for solar water splitting but suffers from poor charge transport and interfacial losses. We combine Ti compensation doping with ultrathin TiN back‐contact interlayers to suppress bulk recombination, enhance carrier mobility and lifetime, and enable efficient carrier extraction, yielding ...
Laura I. Wagner +8 more
wiley +1 more source
In Situ Composition and Thickness Monitoring during (Bi<sub>x</sub>In<sub>1‑x</sub>)<sub>2</sub>Se<sub>3</sub> Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices. [PDF]
Hilse M +9 more
europepmc +1 more source
Characterization and Quantification of Depletion and Accumulation Layers in Solid-State Li+ -Conducting Electrolytes Using In Situ Spectroscopic Ellipsometry. [PDF]
Katzenmeier L +4 more
europepmc +1 more source
A freestanding polymer metasurface is developed to enhance light emission from atomically thin semiconductors. By supporting higher‐order optical resonances that concentrate electromagnetic fields at the surface, the platform significantly improves coupling between light and WS2 monolayer.
Chih‐Zong Deng +10 more
wiley +1 more source
Subpicosecond Spectroscopic Ellipsometry of the Photoinduced Phase Transition in VO2 Thin Films. [PDF]
Gutiérrez Y +8 more
europepmc +1 more source
Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film. [PDF]
Janicek P +6 more
europepmc +1 more source
The moisture‐induced degradation of hygroscopic scintillators limits their performance and lifespan in radiation detection. A 100 nm amorphous Al2O3 film, deposited at room temperature via FCVA with pulsed magnetic field confinement, offers high optical transmittance and ultralow moisture permeability.
Zeyu Yin +14 more
wiley +1 more source

