Results 141 to 150 of about 26,661 (230)

Investigation of Electrochromic, Combinatorial TiO₂-SnO₂ Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. [PDF]

Materials (Basel), 2023
Ismaeel NT, Lábadi Z, Petrik P, Fried M.   +3 more
europepmc   +1 more source

Probing Interfacial Reaction Pathways in Atomic Layer Deposition on Sulfide Superionic Conductors

Small Structures, Volume 7, Issue 5, May 2026.
Atomic layer deposition of Al2O3 on the sulfide superionic conductor Li6PS5Cl proceeds via reactions with native OH, SH, and PS3‐OH surface groups, enabling immediate nucleation and conformal sub‐nanometer coatings. Spectroscopic measurements combined with theory reveal reversible surface chemistry that preserves the sulfide framework, providing ...
Kyobin Park, Aditya Sundar, Vepa Rozyyev, Anil U. Mane, Donghyeon Kang, Chi Thang Nguyen, Jahnavi Manikantan Sudharma, Francisco Lagunas, Hacksung Kim, Fulya Dogan, Zachary D. Hood, Peter Zapol, Justin G. Connell, Jeffrey W. Elam   +13 more
wiley   +1 more source

Towards Real-Time In-Situ Mid-Infrared Spectroscopic Ellipsometry in Polymer Processing. [PDF]

Polymers (Basel), 2021
Ebner A, Zimmerleiter R, Hingerl K, Brandstetter M.   +3 more
europepmc   +1 more source

Simulation of Interference‐Enhanced Raman Amplification for Advanced Microelectronic Applications

physica status solidi (a), Volume 223, Issue 8, 22 April 2026.
This work presents an open‐source tool modeling interference‐enhanced Raman intensities in any multilayered structures. Depending on the stack and laser source, constructive interferences can be exploited to improve strain or composition measurement.
D. Monteil, Y. Mazel, F. Deprat, E. Prevost, R. Duru, D. Le Cunff, E. Nolot, V. H. Le, P. Quéméré, M. Mermoux   +9 more
wiley   +1 more source

Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation for the Assessment of Polymer Layers and for the Application in Biosensing. [PDF]

Polymers (Basel), 2022
Plikusiene I, Maciulis V, Ramanavicius A, Ramanaviciene A.   +3 more
europepmc   +1 more source

A Distributed Bragg Reflector Interface for Filter‐Free Fluorescence Spectro‐Microscopy With High Spectral Tunability

physica status solidi (a), Volume 223, Issue 8, 22 April 2026.
An all‐dielectric TiO2/SiO2 distributed Bragg reflector is engineered as a substrate‐integrated optical filter, enabling filter‐free fluorescence spectro‐microscopy. Nanometer‐scale layer control aligns excitation suppression and emission reflection for specific fluorophores, achieving high‐contrast imaging at sub‐monolayer coverage.
Dibyendu Khan, Chishu Homma, Ahmed Ben Romdhane, Hocine Bahri, Xue Du, Xuan Thang Vu, Sven Ingebrandt, Vivek Pachauri   +7 more
wiley   +1 more source

Optical data of graphene grown by chemical vapor deposition on copper foil using spectroscopic ellipsometry. [PDF]

Data Brief, 2022
Rajab F.
europepmc   +1 more source

Synthesis, Structure, and Thin Film Optical Properties of a Chiral Benzothiazole‐Derived Squaraine

ChemPhysChem, Volume 27, Issue 7, 14 April 2026.
Solution‐processed thin films can be sensitive to the choice of solvent and thermal annealing, which we explore for a chiral benzothiazole squaraine. We observe peculiarly shaped excitonic circular dichroism in uniaxially anisotropic thin films, in which the presumed Davydov bands are spatially distributed exclusively into in‐plane (UDC) and out‐of ...
Marvin F. Schumacher, Gregor Schnakenburg, N. Serdar Sariciftci, Arne Lützen, Manuela Schiek   +4 more
wiley   +1 more source

Pulsed-Source MOCVD of High-k Dielectric Thin Films with in situ Monitoring by Spectroscopic Ellipsometry

, 2003
Endoh, M, Hattori, T, Kurosawa, M, Oda, S, Tsuchiya, Yoshishige, Tung, R. T   +5 more
core   +1 more source

Optical Constants of Several Multilayer Transition Metal Dichalcogenides Measured by Spectroscopic Ellipsometry in the 300-1700 nm Range: High Index, Anisotropy, and Hyperbolicity. [PDF]

ACS Photonics, 2022
Munkhbat B, Wróbel P, Antosiewicz TJ, Shegai TO.   +3 more
europepmc   +1 more source