Results 141 to 150 of about 370,378 (203)

A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry. [PDF]

Nanomaterials (Basel)
Ma L, Xu X, Cui C, Li T, Lou S, Scott PJ, Jiang X, Zeng W.   +7 more
europepmc   +1 more source

Evaluation of Crystalline Volume Fraction of Laser-Annealed Polysilicon Thin Films Using Raman Spectroscopy and Spectroscopic Ellipsometry. [PDF]

Micromachines (Basel), 2021
Pyo J, Lee B, Ryu HY.
europepmc   +1 more source

Hybridization of Gap Plasmons and Grating‐Coupled Surface Plasmon Polaritons in Metal Nanoparticle Cluster Arrays on a Mirror

Advanced Optical Materials, Volume 14, Issue 38, 16 October 2026.
Here we use a template‐assisted self‐assembly approach of metal colloids onto metal films to produce hybrid plasmonic metasurfaces that integrate nanoparticle‐on‐mirror cavities with periodic metal colloid arrays. The resulting coupling between gap plasmons and grating‐coupled surface plasmon polaritons enables programmable hybrid modes with tailored ...
Afroditi Koutsogianni, Xiaoyu Qi, Jose Mendoza‐Carreño, Pedro Moronta, Maria Isabel Alonso, David B. Amabilino, Agustín Mihi   +6 more
wiley   +1 more source

Spectroscopic Ellipsometry and Correlated Studies of AlGaN-GaN HEMTs Prepared by MOCVD. [PDF]

Nanomaterials (Basel)
Yang Y, Liu Y, Li Y, Nafisa MT, Feng ZC, Wang L, Yiin J, Wan L, Klein B, Ferguson I, Sun W.   +10 more
europepmc   +1 more source

Characterization and Quantification of Depletion and Accumulation Layers in Solid-State Li⁺ -Conducting Electrolytes Using In Situ Spectroscopic Ellipsometry. [PDF]

Adv Mater, 2021
Katzenmeier L, Carstensen L, Schaper SJ, Müller-Buschbaum P, Bandarenka AS.   +4 more
europepmc   +1 more source

Inverse‐Designed Superchiral Hot Spot in Dielectric Meta‐Cavity Toward Ultra‐Compact Enantioselective Detection

Advanced Optical Materials, Volume 14, Issue 38, 16 October 2026.
Linearly polarized incident light with normal incidence creates enhanced optical chirality hotspots on the metasurface. Several orders of magnitude optical chirality enhancement offers a promising route toward highly sensitive, compact chiral spectroscopy.
Anastasia Romashkina, Omer Yesilurt, Vahagn Mkhitaryan, Owen Matthiessen, Min Jiang, Evgeny Lyubin, Bayarjargal N. Tugchin, Isabelle Staude, Jer‐Shing Huang, Thomas Pertsch, Alexander V. Kildishev   +10 more
wiley   +1 more source

Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition. [PDF]

ACS Appl Electron Mater, 2022
Bohórquez C, Bakkali H, Delgado JJ, Blanco E, Herrera M, Domínguez M.   +5 more
europepmc   +1 more source

Visible‐Blind Near‐Infrared Organic Vision Sensors for Imaging in Adverse Environmental Conditions

Advanced Optical Materials, Volume 14, Issue 38, 16 October 2026.
This work presents high‐performance visible‐blind NIR OPDs enabled by a multilayer optical modulation layer. The devices achieve strong visible‐light suppression and enhanced NIR sensitivity, enabling robust imaging in foggy or low‐light environments.
Baozhong Deng, Kean Lu, Zhouyi Lu, Yi Li, Gaoyu Dai, Luqiao Yin, Zihan Wang, Bruno Grandidier, Tao Xu, Furong Zhu   +9 more
wiley   +1 more source

In Situ Composition and Thickness Monitoring during (Bi_xIn_1‑x)₂Se₃ Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices. [PDF]

ACS Appl Nano Mater
Hilse M, Niedel J, Zhang Q, Richardella A, Hijazi H, Shallenberger JR, Hengstebeck R, Law S, Samarth N, Peiris FC.   +9 more
europepmc   +1 more source

Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film. [PDF]

Materials (Basel), 2021
Janicek P, Putri M, Kim KH, Lee HJ, Bouska M, Šlang S, Lee HY.   +6 more
europepmc   +1 more source