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Spectroscopic ellipsometry in the infrared range
Thin Solid Films, 1998Abstract Various recent applications of infrared ellipsometry (IR-SE) are reviewed with a particular emphasis on in situ studies. It is shown from the characterisation of hydrogen terminated c-Si surfaces that IR-SE can achieve submonolayer sensitivity. As compared to UV-visible SE, the IR range provides vibrational sensitivity.
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Preface to the proceedings of the 9th conference on spectroscopic ellipsometry (ICSE-9)
Thin Solid Films, 2023Shiyuan Liu, Lingjie Li, Zhigao Hu
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Optical Properties of Cu2O Studied by Spectroscopic Ellipsometry
Journal of the Physical Society of Japan, 1998Taizo Masumi +2 more
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Optical Properties of CuO Studied by Spectroscopic Ellipsometry
Journal of the Physical Society of Japan, 1998Hirotaka Yamaguchi +2 more
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