Results 101 to 110 of about 26,661 (230)

A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry

open access: yesPhotonics
A data-fitting method based on the whale optimization algorithm (WOA) is proposed to determine the thickness and refractive index of films measured by spectroscopic ellipsometry (SE).
Liyuan Ma   +8 more
doaj   +1 more source

Sticky Yet Slippery: Molecular Ordering Reconciles Bubble‐Surface Affinity With Ultralow Friction at the Nanoscale

open access: yesAdvanced Science, EarlyView.
By engineering the molecular order and thickness of PDMS layers, we reconcile the stickiness and slipperiness during bubble transport. AFM measurements and MD simulations further reveal how these nanoscale architectures tune hydrophobic interaction FHB and friction force f.
Shishuang Zhang   +7 more
wiley   +1 more source

Integrated Optoelectronic Model to Predict the External Quantum Efficiency of Single‐Layer TADF Organic Light‐Emitting Diodes

open access: yesAdvanced Electronic Materials, EarlyView.
An experimentally validated optoelectronic device model is presented to describe the efficiency and roll‐off behavior of single‐layer TADF OLEDs. By coupling charge transport, exciton dynamics, and optical outcoupling, the model reproduces the External Quantum Efficiency (EQE) across different emission layer thicknesses and temperatures, offering ...
Jawid Nikan   +4 more
wiley   +1 more source

Ferroelectric characterization and growth optimization of thermally evaporated vinylidene fluoride thin films [PDF]

open access: yes, 2016
Organic thin films have numerous advantages over inorganics in device processing and price. The large polarization of the organic ferroelectric oligomer vinylidene fluoride (VDF) could prove useful for both device applications and the investigation of ...
Adenwalla, Shireen   +5 more
core   +1 more source

Atomic Layer Deposition of Disordered p‐Type SnO Using a Heteroleptic Tin(II) Precursor: Influence of Disorder on P‐Channel SnO Thin‐Film Transistor Characteristics

open access: yesAdvanced Electronic Materials, EarlyView.
Disordered p‐type SnO thin‐films are deposited via atomic layer deposition using a novel heteroleptic precursor. These films enable low‐temperature fabrication of thin‐film transistors with excellent stability and mobility. Their potential compatibility with flexible substrates and integration with n‐type IGZO transistors makes them candidates for ...
Benjamin J. Peek   +15 more
wiley   +1 more source

Silicon Nitride Resistive Memories

open access: yesAdvanced Electronic Materials, EarlyView.
Amorphous SiNx is an attractive resistance switching material for ReRAM applications due to its physicochemical properties, such as humidity resistance, low oxygen diffusivity, and is used as a metal diffusion blocker. By modifying the ratio between N and Si atoms, the microstructure of the SiNx is affected, rendering it possible to change the ...
Alexandros‐Eleftherios Mavropoulis   +7 more
wiley   +1 more source

Structure and Spectroscopic Characterisation of Phenanthroline‐Based Iodobismuthate(III) Complexes Utilised for Raw Acoustic Signal Classification

open access: yesAdvanced Intelligent Discovery, EarlyView.
Memristors based on trimethylsulfonium (phenanthroline)tetraiodobismuthate have been utilised as a nonlinear node in a delayed feedback reservoir. This system allowed an efficient classification of acoustic signals, namely differentiation of vocalisation of the brushtail possum (Trichosurus vulpecula).
Ewelina Cechosz   +4 more
wiley   +1 more source

Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films

open access: yesCrystals
The metal–insulator transition of vanadium dioxide (VO2), a phase change material, has been utilized for various applications. The characterization of the VO2 thin film structure, in both its optical properties and thickness, remains a critical problem ...
Xiaojie Sun   +9 more
doaj   +1 more source

Ground and space based optical analysis of materials degradation in low-Earth-orbit [PDF]

open access: yes
There is strong interest in being able to accurately and sensitively monitor materials degradation in both ground-based and space-based environments. Two optical techniques for sensitive degradation monitoring are reviewed: spectroscopic ellipsometry and
De, Bhola N.   +6 more
core   +1 more source

Study of InGaAs based MODFET structures using variable angle spectroscopic ellipsometry [PDF]

open access: yes
Variable angle spectroscopic ellipsometry was used to estimate the thicknesses of all layers within the optical penetration depth of InGaAs based MODFET structures.
Alterovitz, S. A.   +7 more
core   +1 more source

Home - About - Disclaimer - Privacy