Evaluation of Crystalline Volume Fraction of Laser-Annealed Polysilicon Thin Films Using Raman Spectroscopy and Spectroscopic Ellipsometry. [PDF]
Pyo J, Lee B, Ryu HY.
europepmc +1 more source
Spectroscopic Ellipsometry and Correlated Studies of AlGaN-GaN HEMTs Prepared by MOCVD. [PDF]
Yang Y +10 more
europepmc +1 more source
Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition. [PDF]
Bohórquez C +5 more
europepmc +1 more source
In Situ Composition and Thickness Monitoring during (Bi<sub>x</sub>In<sub>1‑x</sub>)<sub>2</sub>Se<sub>3</sub> Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices. [PDF]
Hilse M +9 more
europepmc +1 more source
Characterization and Quantification of Depletion and Accumulation Layers in Solid-State Li+ -Conducting Electrolytes Using In Situ Spectroscopic Ellipsometry. [PDF]
Katzenmeier L +4 more
europepmc +1 more source
Subpicosecond Spectroscopic Ellipsometry of the Photoinduced Phase Transition in VO2 Thin Films. [PDF]
Gutiérrez Y +8 more
europepmc +1 more source
Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film. [PDF]
Janicek P +6 more
europepmc +1 more source
Membrane-Based In Situ Mid-Infrared Spectroscopic Ellipsometry: A Study on the Membrane Affinity of Polylactide-co-glycolide Nanoparticulate Systems. [PDF]
Romanenko A +8 more
europepmc +1 more source
Temperature Dependence of Optical Properties of MoS2 and WS2 Heterostructures Assessed by Spectroscopic Ellipsometry. [PDF]
Nguyen HT +7 more
europepmc +1 more source
A New Signature for Strong Light-Matter Coupling Using Spectroscopic Ellipsometry. [PDF]
Thomas PA +3 more
europepmc +1 more source

