Results 81 to 90 of about 370,378 (203)

Silicon Nitride Resistive Memories

Advanced Electronic Materials, EarlyView.
Amorphous SiNx is an attractive resistance switching material for ReRAM applications due to its physicochemical properties, such as humidity resistance, low oxygen diffusivity, and is used as a metal diffusion blocker. By modifying the ratio between N and Si atoms, the microstructure of the SiNx is affected, rendering it possible to change the ...
Alexandros‐Eleftherios Mavropoulis, Nikolaos Vasileiadis, Iosif‐Angelos Fyrigos, Emmanouil Stavroulakis, Caroline Bonafos, Pascal Normand, Georgios Ch. Sirakoulis, Panagiotis Dimitrakis   +7 more
wiley   +1 more source

Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver

, 2016
International audienceSpark Plasma Sintered (SPS) silver layers were studied by Spectroscopic Ellipsometry (SE) using an M-2000V spectroscopic ellipsometer from J. A. Woollam Co., Inc.
Schoenstein, Frédéric, Dahoo, Pierre-Richard, Alayli, Nadim, Chong, Christian, Girard, Armelle   +4 more
core   +5 more sources

Nonmonotonic Enhancement of Electro‐Optic Properties of Wurtzite AlN Thin Films by Sc Doping

Advanced Electronic Materials, EarlyView.
EO coefficient, rc, for Sc‐AlN thin films in comparison with that for Mg ZnO thin films (left). Calculated electric field intensity of the fundamental mode supported by the active area that includes Sc‐AlN (right). ABSTRACT Wurtzite ferroelectrics, such as Sc‐doped AlN, have recently attracted considerable attention for their potential in realizing ...
K. Abe, X. Yuan, K. Okamoto, X. Liu, C. Wang, T. Wu, H. Funakubo, S. Kondo, T. Nagasaki, P. Ma, A. Emboras, T. Yamada   +11 more
wiley   +1 more source

Al1−xHfxN$\text{Al$_{1-x}$Hf$_{x}$N}$ Thin Films with Enhanced Piezoelectric Responses for GHz Surface Acoustic Wave Devices

Advanced Electronic Materials, EarlyView.
Reactively sputtered wurtzite Al1‐xHfxN thin films, exhibiting strong c‐axis texture and enhanced piezoelectric response, are demonstrated as a cost‐effective alternative to Al1‐xScxN. X‐ray absorption spectroscopy reveals that cross‐gap N 2p–Hf 5d hybridization increases the Born effective charge and enables a multifold increase in piezoelectric ...
Laura I. Wagner, Verena Streibel, Esperanza Luna, Katarina S. Flashar, Valentin Walbrunn, Walid Anders, Nicole Volkmer, Doreen Steffen, Katrin Morgenroth, Frans Munnik, Tsedenia A. Zewdie, Saswati Santra, Jutta Schwarzkopf, Ian D. Sharp, Mingyun Yuan   +14 more
wiley   +1 more source

Artificial Intelligence for Fluorite Ferroelectric Materials: From Discovery to Optimization

Advanced Electronic Materials, EarlyView.
Artificial intelligence accelerates the discovery and optimization of HfO2‐based fluorite ferroelectrics by linking synthesis, structure, properties, and device performance. Machine learning, deep‐learning analysis, and AI‐driven atomistic modeling enable predictive design, dopant screening, and closed‐loop optimization toward next‐generation ...
Faizan Ali, David Lehninger, Florencio Sánchez, Ignasi Fina   +3 more
wiley   +1 more source

Reveal Non‐Uniform Passivation on Lithium Metal Anode With Operando Spectroscopic Ellipsometry

Advanced Energy Materials, EarlyView.
In‐operando spectroscopic ellipsometry reveals how nucleation and crystallographic orientation govern the non‐uniform growth of native passivation films on lithium metal. Time‐resolved thickness mapping captures island formation and coalescence, while orientation‐dependent measurements show that the equilibrium film on Li(110) is approximately half as ...
Jianyu Li, Hanrui Zhang, Dongliang Chen, Feifei Shi   +3 more
wiley   +1 more source

Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films

Crystals
The metal–insulator transition of vanadium dioxide (VO2), a phase change material, has been utilized for various applications. The characterization of the VO2 thin film structure, in both its optical properties and thickness, remains a critical problem ...
Xiaojie Sun, Qingyuan Cai, Jiao Qi, Baojian Liu, Yuxiang Zheng, Rongjun Zhang, Jing Li, Songyou Wang, Liangyao Chen, Youngpak Lee   +9 more
doaj   +1 more source

Spectroscopic ellipsometry for photovoltaics

, 2018
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of ...
Collins, Robert, Fujiwara, Hiroyuki
core   +1 more source

Generative and Experimental Validation of High Refractive Index Polymers via Domain Knowledge Approach with Small Data

Advanced Intelligent Discovery, EarlyView.
This research demonstrates that the combination of domain knowledge–based multiple regression, multi‐objective Bayesian optimization, and generative models is a suitable prediction tool for candidates of high refractive index polymers, even with the constraints in the model trained on limited data. The experimental validation can reproduce the proposed
Takuya Yokoo, Seigo Watanabe, Hana Matsunaga, Kenichi Oyaizu   +3 more
wiley   +1 more source

Covalent Immobilisation of PVA‐MA Hydrogels on Plasma‐Activated Coatings: Achieving Superior Adhesion by Reagent‐Free Formation of a Nanoscale Primer Layer

Advanced NanoBiomed Research, EarlyView.
Robust attachment of hydrogels to solid substrates is critical to success in cell culture where hydrostatic and contractile forces can contribute to delamination of weakly adhered gels. This novel approach forms a nanometer‐scale, reagent‐free hydrogel primer layer to provide improved resistance to delamination of subsequent bulk hydrogel layers in a ...
Sophia C. Franklin, Clara T. H. Tran, Matthew Hadden, David Martinez‐Martin, Laura Poole‐Warren, Marcela M. M. Bilek, Ulises Aregueta Robles, Aaron D. Gilmour   +7 more
wiley   +1 more source