Results 61 to 70 of about 3,818 (150)
Design of a Multiplex Sensing Platform: AFM as a Nanolithographic Tool
ProceedingsCoupling spectroscopic ellipsometry (SE), quartz crystal microbalance with dissipation (QCM-D), X-ray photoemission spectroscopy (XPS), and atomic force microscopy (AFM), we developed a multi-technique approach to characterize the surface immobilization ...
Silvia Maria Cristina Rotondi +3 more
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Modelling of Optical Damage in Nanorippled ZnO Produced by Ion Irradiation
Crystals, 2019 Here, we report on the production of nanoripples on the surface of ZnO bulk substrates by ion beam erosion with 20 keV Ar+ ions at an oblique incidence (60°).
Andrés Redondo-Cubero +4 more
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CrystalsThe metal–insulator transition of vanadium dioxide (VO2), a phase change material, has been utilized for various applications. The characterization of the VO2 thin film structure, in both its optical properties and thickness, remains a critical problem ...
Xiaojie Sun +9 more
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Atomic layer deposition for hafnium oxide-based meta-optics in the ultraviolet spectral range
Journal of the European Optical Society-Rapid PublicationsHafnium oxide (HfO2) is a high-index dielectric material of growing importance for optical coatings and meta-optical components operating from the ultraviolet (UV) to the visible spectral range.
Siefke Thomas +8 more
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Applications of spectroscopic ellipsometry to microelectronics
Thin Solid Films, 1993 Ellipsometry has been applied to problems in the microelectronics industry from the beginning in the 1960's. More recently spectroscopic ellipsometry has been introduced. In-situ during process ellipsometry offers great promise for monitoring and control of a wide variety of microeletrcnics processes.
openaire +2 more sources
Artificial Intelligence in Ellipsometry: Methods, Challenges, and Opportunities
CrystalsSpectroscopic ellipsometry (SE) is a non-destructive optical technique widely used to extract film thickness, optical constants, surface roughness, and compositional information.
Grazia Giuseppina Politano
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Deterministic reflection contrast ellipsometry for thick multilayer two-dimensional heterostructures
NanophotonicsOptical spectroscopy is a powerful tool for characterizing the properties of two-dimensional (2D) heterostructures. However, extracting the permittivity information of each 2D layer in optically thick heterostructures is challenging because of ...
Lee Kang Ryeol, Youn JinGyu, Yoo SeokJae
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In Situ Monitoring of Aptamer-Protein Binding on a ZnO Surface Using Spectroscopic Ellipsometry. [PDF]
Sensors (Basel), 2023 Alshammari A, van Zalinge H, Sandall I.
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Fast Detection of Uric Acid in Urine for Early Diagnosis Using THz Polarized Waves
SensorsTowards new and improved techniques in liquid biopsy for the diagnosis of diseases, this study reports experimental evidence of a rapid and reliable method based on terahertz (THz) time-domain spectroscopic ellipsometry (TDSE) for the early diagnosis of ...
Zahra Mazaheri +6 more
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Journal of Science: Advanced Materials and DevicesOptimizing light collection is essential to enhance power conversion efficiency in perovskite solar cells (PSCs). Understanding the optical characteristics of perovskite materials is key to designing improved structures and enhancing device performance ...
Eri Widianto +9 more
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