Results 61 to 70 of about 26,661 (230)
Spectroscopic ellipsometry utilizing frequency division multiplexed lasers
Communications PhysicsSpectroscopic ellipsometry (SE), which measures the thickness of thin films in a non-contact way with an accuracy of angstroms, has been widely used for optical metrology. Several types of SE are available both commercially and in research, although they
Jongkyoon Park, Yong Jai Cho, Won Chegal
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Variable Angle Spectroscopic Ellipsometry Characterization of Graphene Oxide in Methanol Films
Crystals, 2022 It has been widely established that solvents modify the functional groups on the graphene oxide (GO) basal plane and, thus, modify its reactivity. Despite the increasing interest in GO films, a less studied aspect is the influence of methanol on the ...
Grazia Giuseppina Politano +1 more
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On circular Bragg regimes in ellipsometry spectra of ambichiral sculptured thin films
, 2013 The generalized ellipsometry formalism is used for a right handed ambichiral sculptured thin film.The amplitude ratios and phase differences of this structure are extracted from the amplitude transmission ratios.
Babaei, F
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Surface disorder production during plasma immersion implantation and high energy ion implantation [PDF]
, 1996 High-depth-resolution Rutherford Backscattering Spectrometry (RBS) combined with channeling technique was used to analyze the surface layer formed during plasma immersion ion implantation (PIII) of single crystal silicon substrates.
El-Sherbiny, M.A. +6 more
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A Colloidal Quantum Dot Thermistor and Bolometer
Advanced Materials, EarlyView.This work introduces colloidal quantum dot thermistors employing a potential barrier structure to tune the activation energy of transport and hence the temperature coefficient of resistance (TCR). Upon integration with plasmonic absorbers, the CQD‐based bolometer device enables room‐temperature wavelength‐selective photodetection across the mid‐ to ...
Gaurav Kumar +7 more
wiley +1 more source
Beilstein Journal of Nanotechnology, 2014 The optical and electrical properties of terbium(III) bis(phthalocyanine) (TbPc2) films on cobalt substrates were studied using variable angle spectroscopic ellipsometry (VASE) and current sensing atomic force microscopy (cs-AFM).
Peter Robaschik +11 more
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Ligand‐Mediated Surface Carrier Modulation in Perovskite Nanocrystals for Charge‐Symmetric LEDs
Advanced Materials, EarlyView.A hydrolysis‐assisted ligand exchange strategy enables surface carrier modulation of perovskite nanocrystals using a multifunctional π‐conjugated ligand. This molecular surface design achieves charge balance and recombination‐zone symmetry in light‐emitting diodes (LEDs), which leads to high‐efficiency perovskite LEDs and establishes a general platform
Jongho Park +11 more
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Dielectric tensor of monoclinic Ga$_2$O$_3$ single crystals in the spectral range $0.5 - 8.5\,$eV [PDF]
, 2015 The dielectric tensor of $\beta$-Ga$_2$O$_3$ was determined by generalized spectroscopic ellipsometry in a wide spectral range from $0.5\,\mathrm{eV}$ to $8.5\,\mathrm{eV}$ as well as by calculation including quasiparticle bands and excitonic effects ...
Bechstedt, Friedhelm +4 more
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Advanced Materials, EarlyView.The magnetic high entropy oxide perovskite Nd(Cr0.2Mn0.2Fe0.2Co0.2Ni0.2)O3 exhibits a substantially large dielectric constant (εr) at room temperature, which shows distinct anionic and cationic contributions in the form of zero and finite bias peaks, respectively, down to its magnetic transition temperature (Tmag).
Roxana Capu +19 more
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CrystalsIn this paper, we present a method for retrieving the optical properties of a nano-designed TiN/AlN composite dielectric, using spectroscopic ellipsometry for experimental measurements and wave optics simulations for numerical analysis. Composite cermets
Mohamed El Hachemi +2 more
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