Results 51 to 60 of about 3,818 (150)

Spectroscopic ellipsometry utilizing frequency division multiplexed lasers

Communications Physics
Spectroscopic ellipsometry (SE), which measures the thickness of thin films in a non-contact way with an accuracy of angstroms, has been widely used for optical metrology. Several types of SE are available both commercially and in research, although they
Jongkyoon Park, Yong Jai Cho, Won Chegal
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The effect of PECVD plasma decomposition on the wettability and dielectric constant changes in silicon modified DLC films for potential MEMS and low stiction applications

AIP Advances, 2012
We have carried out investigations aimed at understanding the mechanism responsible for a water contact angle increase of up to ten degrees and a decrease in dielectric constant in silicon modified hydrogenated amorphous carbon films compared to ...
A. A. Ogwu, T. I. T. Okpalugo, J. A. D. McLaughlin   +2 more
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Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt

Beilstein Journal of Nanotechnology, 2014
The optical and electrical properties of terbium(III) bis(phthalocyanine) (TbPc2) films on cobalt substrates were studied using variable angle spectroscopic ellipsometry (VASE) and current sensing atomic force microscopy (cs-AFM).
Peter Robaschik, Pablo F. Siles, Daniel Bülz, Peter Richter, Manuel Monecke, Michael Fronk, Svetlana Klyatskaya, Daniel Grimm, Oliver G. Schmidt, Mario Ruben, Dietrich R. T. Zahn, Georgeta Salvan   +11 more
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Spectroscopic Ellipsometry and Wave Optics: A Dual Approach to Characterizing TiN/AlN Composite Dielectrics

Crystals
In this paper, we present a method for retrieving the optical properties of a nano-designed TiN/AlN composite dielectric, using spectroscopic ellipsometry for experimental measurements and wave optics simulations for numerical analysis. Composite cermets
Mohamed El Hachemi, Nikhar Khanna, Emanuele Barborini   +2 more
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Study on the Electrodeposition of Lead with In-Situ Ellipsometry

International Journal of Electrochemical Science, 2015
In this study, we applied the in situ spectroscopic ellipsometry (SE) technology to the electrochemical test, and combined with cyclic voltammetry (CV) mainly researched underpotential-deposited (UPD) of Pb on polycrystalline Cu.
Xiaolei Ren, Shengtao Zhang, Lei Guo, Wenpo Li, Jinglei Lei, Yanru Wang   +5 more
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Optical properties of graphene film growing on a thin copper layer

Semiconductor Physics, Quantum Electronics & Optoelectronics, 2016
Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements.
T.S. Rozouvan
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Infrared Dielectric Function of Dragonfly Dielectric Ink 1092 Polymer from 300 cm⁻¹ to 6000 cm⁻¹

Optics
This work focuses on the characterization of the complex dielectric function of a polymer material, which is UV-cured dielectric ink 1092, used in the DragonFly IV 3D inkjet printer.
Dustin Louisos, Joseph Engeland, Nuren Z. Shuchi, Samuel I. Gatley, John F. Federici, Benjamin Thomas, Ian Gatley, Glenn D. Boreman, Tino Hofmann   +8 more
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Monitoring phase transitions in β-W thin films using ellipsometry

Materials Research Express
Understanding and monitoring phase transformations in tungsten thin films is crucial for advancing applications in spintronics, including MRAM technology.
Raid Bader, Argyrios Malapanis, Haralabos Efstathiadis   +2 more
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Rapid, non-destructive evaluation of ultrathin WSe2 using spectroscopic ellipsometry

APL Materials, 2014
The utilization of tungsten diselenide (WSe2) in electronic and optoelectronic devices depends on the ability to understand and control the process-property relationship during synthesis.
Sarah M. Eichfeld, Chad M. Eichfeld, Yu-Chuan Lin, Lorraine Hossain, Joshua A. Robinson   +4 more
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A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry

Photonics
A data-fitting method based on the whale optimization algorithm (WOA) is proposed to determine the thickness and refractive index of films measured by spectroscopic ellipsometry (SE).
Liyuan Ma, Xipeng Xu, Changcai Cui, Mai Gao, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, Wenhan Zeng   +8 more
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