Results 31 to 40 of about 26,661 (230)
Anisotropy, phonon modes, and lattice anharmonicity from dielectric function tensor analysis of monoclinic cadmium tungstate [PDF]
, 2017 We determine the frequency dependence of four independent CdWO$_4$ Cartesian dielectric function tensor elements by generalized spectroscopic ellipsometry within mid-infrared and far-infrared spectral regions.
Knight, S. +3 more
core +3 more sources
Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co [PDF]
Журнал нано- та електронної фізики, 2013 Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm.
A.T. Morchenko +7 more
doaj
Optical properties of Alexa™ 488 and Cy™5 immobilized on a glass surface
BioTechniques, 2005 The absorption and emission spectra were measured for Cy™5 and Alexa™ 488 fluorophores confined on a glass surface. The data were obtained using fluorometry and spectroscopic ellipsometry.
Lili Wang +2 more
doaj +1 more source
refellips: A Python package for the analysis of variable angle spectroscopic ellipsometry data
SoftwareX, 2022 refellips is an open-source analysis package written in Python for modelling variable angle spectroscopic ellipsometry data. The software is designed to be used in Jupyter notebook environments or simple Python scripts, facilitating reproducible research.
Hayden Robertson +5 more
doaj +1 more source
Developments in THz range ellipsometry
, 2013 Ellipsometry is a technique whereby the measurement of the two orthogonal polarization components of light reflected at glancing incidence allows a characterization of the optical properties of a material at a particular frequency.
Armitage, N. P., Neshat, M.
core +1 more source
Imaging spectroscopic ellipsometry of MoS2 [PDF]
Journal of Physics: Condensed Matter, 2016 Micromechanically exfoliated mono- and multilayers of molybdenum disulfide (MoS2) are investigated by spectroscopic imaging ellipsometry. In combination with knife edge illumination, MoS2 flakes can be detected and classified on arbitrary flat and also transparent substrates with a lateral resolution down to 1-2 µm.
S, Funke +5 more
openaire +2 more sources
, 2012 This paper presents the preliminary results of optical characterization using spectroscopic ellipsometry of wurtzite indium gallium nitride (InxGa1-xN) thin films with medium indium content (0 ...
McLaughlin, D. V. P., Pearce, Joshua M.
core +3 more sources
Laser-Driven Light Sources for Nanometrology Applications
Journal of Microelectronic Manufacturing, 2019 Laser-driven light sources (LDLS) have ultrahigh-brightness and broad wavelength range. They are ideal radiation sources for optical metrology tools for advanced process control in semiconductor manufacturing.
Huiling Zhu, Paul Blackborow
doaj +1 more source
Spectroscopic ellipsometry for active nano- and meta-materials
Nanotechnology Reviews, 2014 Spectroscopic ellipsometry (SE) is a powerful technique for the characterization of materials, which is able to probe in a sensitive way their nanostructure as well as to get rich information about their dielectric properties, through the interaction of ...
Toudert Johann
doaj +1 more source
, 2013 Infrared spectroscopic ellipsometry is applied to investigate the free-charge carrier properties of Mg-doped InN films. Two representative sets of In-polar InN grown by molecular beam epitaxy with Mg concentrations ranging from $1.2\times10^{17}$ cm$^{-3}
Araki, T. +8 more
core +1 more source