Results 21 to 30 of about 370,378 (203)

Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology [PDF]

Nature Communications
We propose an ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry (IMMSE) system for semiconductor metrology. The IMMSE system achieves large-area measurements with a 20 mm × 20 mm field of view (FOV)—the largest FOV reported to date—and a
Juntaek Oh, Jaehyeon Son, Changhyeong Yoon, Eunsoo Hwang, Jinwoo Ahn, Jaewon Lee, Jinsoo Lee, Jiyong Shin, Donggun Lee, Seunga Lim, Jeongho Ahn, Younghoon Sohn, Sangjin Hyun, Myungjun Lee, Taeyong Jo   +14 more
doaj   +2 more sources

Polarization modulated spectroscopic ellipsometry-based surface plasmon resonance biosensor for E. coli K12 detection [PDF]

Scientific Reports
In this work, we report on the application of the polarization modulated spectroscopic ellipsometry-based surface plasmon resonance method for sensitive detection of microorganisms in Kretschmann configuration.
Soraya Zangenehzadeh, Emil Agocs, Fenja Schröder, Nassima Amroun, Rebekka Biedendieck, Dieter Jahn, Axel Günther, Lei Zheng, Bernhard Roth, Hans-Hermann Johannes, Wolfgang Kowalsky   +10 more
doaj   +2 more sources

An introduction to terahertz time-domain spectroscopic ellipsometry

APL Photonics, 2022
In the past, terahertz spectroscopy has mainly been performed based on terahertz time-domain spectroscopy systems in a transmission or a window/prism-supported reflection configuration.
X. Chen, E. Pickwell-MacPherson
doaj   +1 more source

Characterization of amorphous carbon films from 5 nm to 200 nm on single-side polished a-plane sapphire substrates by spectroscopic ellipsometry

Frontiers in Physics, 2022
In this work, a series of amorphous carbon films were deposited on a-plane sapphire substrates by magnetron sputtering with deposition time from 15 min to 8 h, in order to investigate the thickness and optical properties in the process of growth in a non-
Ziqing Li, Ziqing Li, Ziqing Li, Changcai Cui, Changcai Cui, Xiaolong Zhou, Subiao Bian, Subiao Bian, Subiao Bian, Oriol Arteaga, Oriol Arteaga, Xipeng Xu, Xipeng Xu   +12 more
doaj   +1 more source

Characterisation of nanodimensional structures using spectroscopic ellipsometry [PDF]

Hemijska Industrija, 2009
In this paper, using spectroscopic ellipsometry we studied the optical properties of thin films, nanocrystals and carbon nanotubes in UV-VIS-NIR range. With a three-phase model, we calculated the thickness of the SiO2 film on a silicon substrate.
Mirić Milka M., Radović Marko B., Gajić Radoš B., Dohčević-Mitrović Zorana D., Popović Zoran V.   +4 more
doaj   +1 more source

Ellipsometric analysis of isothermally devitrified metallic glasses

Optical Materials: X, 2021
Effects of devitrification in metallic glasses are of particular interest for their utilization in various applications as the phase transformation from amorphous to crystalline state is known to significantly change their properties.
Ceren Uzun, Chandra Sekhar Meduri, Shweta Jagdale, Golden Kumar, Ayrton A. Bernussi   +4 more
doaj   +1 more source

Analysis of Toxic Amyloid Fibril Interactions at Natively Derived Membranes by Ellipsometry [PDF]

, 2015
There is an ongoing debate regarding the culprits of cytotoxicity associated with amyloid disorders. Although small pre-fibrillar amyloid oligomers have been implicated as the primary toxic species, the fibrillar amyloid material itself can also induce ...
Smith, Rachel A. S., Xue, Wei-Feng, Blakeman Ben J. F., Blakeman, Ben J. F., Smith, David P., Benjamin Abell (769585), Rachel A S Smith, David P. Smith (131751), Benjamin Abell, Wei-Feng Xue (610029), Ben J F Blakeman, Aleksey Nabok, David P Smith, Rachel A. S. Smith (769582), Smith Rachel A. S., Xue Wei-Feng, Nabok Aleksey, Abell Benjamin, Wei-Feng Xue, Ben J. F. Blakeman (769584), Abell, Benjamin, Aleksey Nabok (769583), Smith David P., Nabok, Aleksey, Leonenko, Zoya   +24 more
core   +2 more sources

Fundamentals and applications of spectroscopic ellipsometry

Química Nova, 2002
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing substrates and overlayers. A brief historical development of ellipsometry and the basic principles necessary to understand how an ellipsometer works are ...
Débora Gonçalves, Eugene A. Irene
doaj   +1 more source

Spectroscopic ellipsometry study of gold nanostructures for LSPR bio-sensing applications

Sensing and Bio-Sensing Research, 2017
This main aim of this work is the development of optical biosensors based on the LSPR phenomenon in nano-structured gold films suitable for detection of low molecular weight analytes such as mycotoxins.
Ali Ghamin Al-Rubaye, Alexei Nabok, Anna Tsargorodska   +2 more
doaj   +1 more source

The growth of Mg2TiO4 single crystals using a four-mirror furnace [PDF]

Journal of the Serbian Chemical Society, 2011
A single crystal of Mg2TiO4 was grown by the travelling solvent float zone (TSFZ) method. The lattice parameter a = 0.8444(8) nm was determined by X-ray powder diffraction analysis.
Golubović Aleksandar, Radović Marko
doaj   +1 more source