Results 1 to 10 of about 370,378 (203)

Enhanced Measurement Accuracy for Nanostructures Using Hybrid Metrology

open access: yesFrontiers in Physics, 2022
Light-matter interplay is widely used for analyzing the topology of surfaces on small scales for use in areas such as nanotechnology, nanoelectronics, photonics, and advanced materials.
Poul-Erik Hansen   +3 more
doaj   +1 more source

Optical properties of Alexa™ 488 and Cy™5 immobilized on a glass surface

open access: yesBioTechniques, 2005
The absorption and emission spectra were measured for Cy™5 and Alexa™ 488 fluorophores confined on a glass surface. The data were obtained using fluorometry and spectroscopic ellipsometry.
Lili Wang   +2 more
doaj   +1 more source

refellips: A Python package for the analysis of variable angle spectroscopic ellipsometry data

open access: yesSoftwareX, 2022
refellips is an open-source analysis package written in Python for modelling variable angle spectroscopic ellipsometry data. The software is designed to be used in Jupyter notebook environments or simple Python scripts, facilitating reproducible research.
Hayden Robertson   +5 more
doaj   +1 more source

Spectroscopic ellipsometry for active nano- and meta-materials

open access: yesNanotechnology Reviews, 2014
Spectroscopic ellipsometry (SE) is a powerful technique for the characterization of materials, which is able to probe in a sensitive way their nanostructure as well as to get rich information about their dielectric properties, through the interaction of ...
Toudert Johann
doaj   +1 more source

Laser-Driven Light Sources for Nanometrology Applications

open access: yesJournal of Microelectronic Manufacturing, 2019
Laser-driven light sources (LDLS) have ultrahigh-brightness and broad wavelength range. They are ideal radiation sources for optical metrology tools for advanced process control in semiconductor manufacturing.
Huiling Zhu, Paul Blackborow
doaj   +1 more source

Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

open access: yesScience and Technology of Advanced Materials, 2016
We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions.
Jakub Zázvorka   +5 more
doaj   +1 more source

Measured optical constants of Pd77.5Cu6Si16.5 bulk metallic glass

open access: yesOptical Materials: X, 2019
Optical constants of Pd77.5Cu6Si16.5 alloy were determined experimentally using spectroscopic ellipsometry measurements on bulk specimens. Values of the complex refractive index of the glassy metallic alloys are compared to their crystalline counterparts
Lyndsey McMillon-Brown   +6 more
doaj   +1 more source

Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

open access: yesPhotonics, 2021
The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics.
Najat Andam   +4 more
doaj   +1 more source

Infrared metamaterial by RF magnetron sputtered ZnO/Al:ZnO multilayers

open access: yesAIP Advances, 2018
Hyperbolic metamaterials create artificial anisotropy using metallic wires suspended in dielectric media or alternating layers of a metal and dielectric (Type I or Type II).
Kevin C. Santiago   +4 more
doaj   +1 more source

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

open access: yesApplied Sciences, 2022
The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color.
Chris E. Finlayson   +2 more
doaj   +1 more source

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