Spectroscopic ellipsometry for low-dimensional materials and heterostructures [PDF]
Nanophotonics, 2022 Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of ...
Yoo SeokJae, Park Q-Han
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Dual-comb spectroscopic ellipsometry [PDF]
Nature Communications, 2017 Spectroscopic ellipsometry is an established technique to characterize the optical properties of a material. Here, Minamikawa et al. combine the method with dual-comb spectroscopy, which allows them to obtain ellipsometric parameters including the phase ...
Takeo Minamikawa +10 more
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Optical transmission and spectroscopic ellipsometry data of fused Quartz: Estimating dielectric function with Krönig-Kramers analysisMendeley Data [PDF]
Data in BriefThe manuscript discusses the procedure of estimating refractive index from optical transmission data of a solid material. Fused Quartz is used as the standard sample in this manuscript.
Sanat Kumar Gogoi +1 more
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Fundamentals and applications of spectroscopic ellipsometry [PDF]
Química Nova, 2002 This paper describes the use of ellipsometry as a precise and accurate technique for characterizing substrates and overlayers. A brief historical development of ellipsometry and the basic principles necessary to understand how an ellipsometer works are ...
Débora Gonçalves, Eugene A. Irene
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Metasurface array for single-shot spectroscopic ellipsometry [PDF]
Light: Science & ApplicationsSpectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. Most conventional ellipsometers utilize mechanically rotating polarizers and grating-based spectrometers for ...
Shun Wen +5 more
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Rotating compensator spectroscopic ellipsometry based on frequency division multiplexing with retardation calibration [PDF]
Scientific ReportsSpectroscopic ellipsometry (SE) is widely used to obtain valuable information about materials such as optical constants or film thickness in a non-destructive way.
Jongkyoon Park +4 more
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In Situ Dynamic Spectroscopic Ellipsometry Characterization of Cu-Ligated Mercaptoalkanoic Acid “Molecular” Ruler Multilayers [PDF]
MicromachinesHybrid strategies that combine conventional top-down lithography with bottom-up molecular assembly are of interest for a range of applications including nanolithography and sensors.
Alexandra M. Patron +2 more
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Spectroscopic ellipsometry modelling of Cr+ implanted copper oxide thin films [PDF]
Scientific Reports, 2023 In this paper, we present modelling of spectroscopic ellipsometry data. The measured samples are thin films of copper oxides modified with the ion implantation method. The samples were prepared using reactive magnetron sputtering.
K. Ungeheuer +3 more
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Investigation of Combinatorial WO3-MoO3 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models [PDF]
Nanomaterials, 2022 Reactive (Ar-O2 plasma) magnetron sputtered WO3-MoO3 (nanometer scaled) mixed layers were investigated and mapped by Spectroscopic Ellipsometry (SE). The W- and Mo-targets were placed separately, and 30 × 30 cm glass substrates were slowly moved under ...
Miklos Fried +5 more
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Deep Learning for Rapid Analysis of Spectroscopic Ellipsometry Data
Advanced Photonics Research, 2021 High‐throughput experimental approaches to rapidly develop new materials require high‐throughput data analysis methods to match. Spectroscopic ellipsometry is a powerful method of optical properties characterization, but for unknown materials and/or ...
Yifei Li +4 more
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