Results 11 to 20 of about 3,881 (216)

Spectroscopic Ellipsometry of Nanocrystalline Diamond Film Growth

ACS Omega, 2017
With the retention of many of the unrivaled properties of bulk diamond but in thin-film form, nanocrystalline diamond (NCD) has applications ranging from micro-/nano-electromechanical systems to tribological coatings. However, with Young's modulus, transparency, and thermal conductivity of films all dependent on the grain size and nondiamond content ...
Evan L. H. Thomas, Soumen Mandal, Ashek-I-Ahmed, John Emyr Macdonald, Thomas G. Dane, Jonathan Rawle, Chia-Liang Cheng, Oliver A. Williams   +7 more
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Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology [PDF]

Nature Communications
We propose an ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry (IMMSE) system for semiconductor metrology. The IMMSE system achieves large-area measurements with a 20 mm × 20 mm field of view (FOV)—the largest FOV reported to date—and a
Juntaek Oh, Jaehyeon Son, Changhyeong Yoon, Eunsoo Hwang, Jinwoo Ahn, Jaewon Lee, Jinsoo Lee, Jiyong Shin, Donggun Lee, Seunga Lim, Jeongho Ahn, Younghoon Sohn, Sangjin Hyun, Myungjun Lee, Taeyong Jo   +14 more
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Polarization modulated spectroscopic ellipsometry-based surface plasmon resonance biosensor for E. coli K12 detection [PDF]

Scientific Reports
In this work, we report on the application of the polarization modulated spectroscopic ellipsometry-based surface plasmon resonance method for sensitive detection of microorganisms in Kretschmann configuration.
Soraya Zangenehzadeh, Emil Agocs, Fenja Schröder, Nassima Amroun, Rebekka Biedendieck, Dieter Jahn, Axel Günther, Lei Zheng, Bernhard Roth, Hans-Hermann Johannes, Wolfgang Kowalsky   +10 more
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Neural network-based analysis algorithm on Mueller matrix data of spectroscopic ellipsometry for the structure evaluation of nanogratings with various optical constants [PDF]

Nanophotonics
Accurate and fast characterization of nanostructures using spectroscopic ellipsometry (SE) is required in both industrial and research fields. However, conventional methods used in SE data analysis often face challenges in balancing accuracy and speed ...
Jung Juwon, Kim Nagyeong, Kim Kibaek, Park Jongkyoon, Cho Yong Jai, Chegal Won, Kim Young-Joo   +6 more
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Broadband femtosecond spectroscopic ellipsometry [PDF]

Review of Scientific Instruments, 2021
We present a setup for time-resolved spectroscopic ellipsometry in a pump–probe scheme using femtosecond laser pulses. As a probe, the system deploys supercontinuum white light pulses that are delayed with respect to single-wavelength pump pulses. A polarizer–sample–compensator–analyzer configuration allows ellipsometric measurements by scanning the ...
Steffen Richter, Mateusz Rebarz, Oliver Herrfurth, Shirly Espinoza, Rüdiger Schmidt-Grund, Jakob Andreasson   +5 more
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An introduction to terahertz time-domain spectroscopic ellipsometry

APL Photonics, 2022
In the past, terahertz spectroscopy has mainly been performed based on terahertz time-domain spectroscopy systems in a transmission or a window/prism-supported reflection configuration.
X. Chen, E. Pickwell-MacPherson
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Characterization of amorphous carbon films from 5 nm to 200 nm on single-side polished a-plane sapphire substrates by spectroscopic ellipsometry

Frontiers in Physics, 2022
In this work, a series of amorphous carbon films were deposited on a-plane sapphire substrates by magnetron sputtering with deposition time from 15 min to 8 h, in order to investigate the thickness and optical properties in the process of growth in a non-
Ziqing Li, Ziqing Li, Ziqing Li, Changcai Cui, Changcai Cui, Xiaolong Zhou, Subiao Bian, Subiao Bian, Subiao Bian, Oriol Arteaga, Oriol Arteaga, Xipeng Xu, Xipeng Xu   +12 more
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Characterisation of nanodimensional structures using spectroscopic ellipsometry [PDF]

Hemijska Industrija, 2009
In this paper, using spectroscopic ellipsometry we studied the optical properties of thin films, nanocrystals and carbon nanotubes in UV-VIS-NIR range. With a three-phase model, we calculated the thickness of the SiO2 film on a silicon substrate.
Mirić Milka M., Radović Marko B., Gajić Radoš B., Dohčević-Mitrović Zorana D., Popović Zoran V.   +4 more
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Ellipsometric analysis of isothermally devitrified metallic glasses

Optical Materials: X, 2021
Effects of devitrification in metallic glasses are of particular interest for their utilization in various applications as the phase transformation from amorphous to crystalline state is known to significantly change their properties.
Ceren Uzun, Chandra Sekhar Meduri, Shweta Jagdale, Golden Kumar, Ayrton A. Bernussi   +4 more
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Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization [PDF]

Applied Spectroscopy, 2013
This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk
Garcia-Caurel, Enric, De Martino, Antonello, Gaston, Jean-Paul, Yan, Li   +3 more
openaire   +3 more sources