Results 41 to 50 of about 370,378 (203)

Spectroscopic ellipsometry utilizing frequency division multiplexed lasers

Communications Physics
Spectroscopic ellipsometry (SE), which measures the thickness of thin films in a non-contact way with an accuracy of angstroms, has been widely used for optical metrology. Several types of SE are available both commercially and in research, although they
Jongkyoon Park, Yong Jai Cho, Won Chegal
doaj   +1 more source

Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy

, 2022
S.433-437Silica xerogel films with low dielectric constant were prepared by means of a sol-gel spin-coating method using different aging and hydrophobisation conditions.
Himcinschi, C., Frühauf, S., Gessner, T., Zahn, D.R.T., Friedrich, M., Schulz, S.E.   +5 more
core   +1 more source

Thickness‐Defined Transport Regime Toward Near‐Ideal Area‐Type Switching

Advanced Materials, EarlyView.
By thinning the oxide layer, memristors pass from diode‐like and battery‐effect‐dominated behavior toward eventual short‐circuit failure. Within the intermediate 5–6 nm window, they reach a near‐ideal analog area‐type switching regime, featuring symmetric hysteresis, area‐dependent conductance, and continuous linear programming of HRS and LRS with ...
Cuo Wu, Junjie Zhao, Richard Schroedter, Jason Vincent, Hampus Hoffman, Leif Riemenschneider, Abdallh Herbawe, Hao Shen, Ronald Tetzlaff, Stefan Slesazeck, Gianaurelio Cuniberti, Thomas Mikolajick, Benjamin Max   +12 more
wiley   +1 more source

The effect of PECVD plasma decomposition on the wettability and dielectric constant changes in silicon modified DLC films for potential MEMS and low stiction applications

AIP Advances, 2012
We have carried out investigations aimed at understanding the mechanism responsible for a water contact angle increase of up to ten degrees and a decrease in dielectric constant in silicon modified hydrogenated amorphous carbon films compared to ...
A. A. Ogwu, T. I. T. Okpalugo, J. A. D. McLaughlin   +2 more
doaj   +1 more source

Antibody‐Precomplexed Hemagglutinin Constructs Multivalently Bind Sialylated Glycan Receptors with Variable Valencies

Advanced Materials Interfaces, EarlyView.
Hemagglutinin precomplexation with antibodies (Abs) results in broad valency distributions, though it increases the total avidity from mM to nM to high nM. The valency distribution and the orientation of multivalent HA‐Ab complexes determine the extent of binding to different types of assays, whether the receptors are displayed in 2D or 3D.
Daniel Y. E. L. Tambuwun, María Ríos Carrasco, Elif Uslu, Geert‐Jan P. H. Boons, Nadia J. Mokiem, Albert J. R. Heck, Victor C. Yin, Robert P. de Vries, Jurriaan Huskens   +8 more
wiley   +1 more source

Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt

Beilstein Journal of Nanotechnology, 2014
The optical and electrical properties of terbium(III) bis(phthalocyanine) (TbPc2) films on cobalt substrates were studied using variable angle spectroscopic ellipsometry (VASE) and current sensing atomic force microscopy (cs-AFM).
Peter Robaschik, Pablo F. Siles, Daniel Bülz, Peter Richter, Manuel Monecke, Michael Fronk, Svetlana Klyatskaya, Daniel Grimm, Oliver G. Schmidt, Mario Ruben, Dietrich R. T. Zahn, Georgeta Salvan   +11 more
doaj   +1 more source

Expanded beam (macro-imaging) ellipsometry

, 2022
S.2730-2736Our aim was to make possible to use spectroscopic ellipsometry for mapping purposes during one measuring cycle (minimum one rotation period of polarizer or analyzer) on many sample points.
Petrik, P., Nutsch, A., Juhasz, G., Fried, M., Major, C., Horvath, Z., Polgar, O.   +6 more
core   +1 more source

Wafer‐Scale Top‐Down Patterning of Metal Halide Perovskites

Advanced Materials Technologies, EarlyView.
Wafer‐scale patterning of metal halide perovskite films is demonstrated on 150 mm substrates using a chemically amplified resist, polymethyl methacrylate (CAR‐PMMA) and a single reactive ion etching step. The streamlined process preserves film luminescence while defining submicrometer features across the full wafer, enabling dense, scalable integration
Federico Fabrizi, Ardeshir Esteki, Holger Lerch, Saeed Goudarzi, Liudmila Starodubtceva, Gerhard Müller‐Newen, Maryam Mohammadi, Max C. Lemme   +7 more
wiley   +1 more source

Dielectric Permittivity Tensor of Muscovite for Next Generation All Van Der Waals Broadband Photonic Components

Advanced Optical Materials, EarlyView.
Low‐index and low‐loss vdW muscovite represents an emerging robust dielectric platform for the creation of next‐generation all‐vdW nanophotonic architectures. Its utilization as a low‐index building‐block in all‐vdW multilayers enables extreme optical contrast when paired with MoS2, paving the way to the realization of few‐layer ultrathin DBS ...
Meri H. Hayrapetyan, Maksim L. Sargsyan, Davit A. Karakhanyan, Ani P. Khachatryan, Maria A. Levonyan, Dmitrii Litvinov, Maciej Koperski, Artsruni V. Margaryan, Makars Šiškins, Konstantin S. Novoselov, Davit A. Ghazaryan   +10 more
wiley   +1 more source

Spectroscopic Ellipsometry and Wave Optics: A Dual Approach to Characterizing TiN/AlN Composite Dielectrics

Crystals
In this paper, we present a method for retrieving the optical properties of a nano-designed TiN/AlN composite dielectric, using spectroscopic ellipsometry for experimental measurements and wave optics simulations for numerical analysis. Composite cermets
Mohamed El Hachemi, Nikhar Khanna, Emanuele Barborini   +2 more
doaj   +1 more source