Results 41 to 50 of about 26,661 (230)

The optical properties of transferred graphene and the dielectrics grown on it obtained by ellipsometry

open access: yes, 2018
Graphene layers grown by chemical vapour deposition (CVD) method and transferred from Cu-foils to the oxidized Si-substrates were investigated by spectroscopic ellipsometry (SE), Raman and X-Ray Photoelectron Spectroscopy (XPS) methods.
Alles, Harry   +6 more
core   +1 more source

A Surface‐engineered Microfluidic Device for Antibody‐Mediated Negative Selection of High‐Quality Sperm for Assisted Reproduction

open access: yesAdvanced Functional Materials, EarlyView.
This study reports a microfluidic device with a functionalized surface utilizing a polyoxazoline coating and covalently immobilized gold nanoparticles and anti‐phosphatidylserine antibody. The device efficiently eliminates pre‐apoptotic and apoptotic spermatozoa and yields sperm with substantially improved quality and low DNA damage, offering a simple ...
Soraya Rasi Ghaemi   +5 more
wiley   +1 more source

Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

open access: yesPhotonics, 2021
The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics.
Najat Andam   +4 more
doaj   +1 more source

Shaping Ti3C2 MXene Nanospheres for Precision Near‐Infrared Photothermal Therapy

open access: yesAdvanced Functional Materials, EarlyView.
In this study, we report producing spherical MXenes via fs laser fragmentation of Ti3C2 flakes in liquid medium. The nanoparticles demonstrated pronounced light absorption and high photothermal conversion efficiencies of 68% and 63% under heating with NIR‐I and NIR‐II lasers, respectively.
Julia S. Babkova   +21 more
wiley   +1 more source

Measured optical constants of Pd77.5Cu6Si16.5 bulk metallic glass

open access: yesOptical Materials: X, 2019
Optical constants of Pd77.5Cu6Si16.5 alloy were determined experimentally using spectroscopic ellipsometry measurements on bulk specimens. Values of the complex refractive index of the glassy metallic alloys are compared to their crystalline counterparts
Lyndsey McMillon-Brown   +6 more
doaj   +1 more source

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

open access: yesApplied Sciences, 2022
The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color.
Chris E. Finlayson   +2 more
doaj   +1 more source

Atomic‐Scale Light Coupling Control in Ultrathin Photonic Membranes

open access: yesAdvanced Functional Materials, EarlyView.
Ultrathin photonic nanomembranes provide atomic‐scale control over the coupling between incident light and high‐Q photonic modes, enabling angstrom‐level resonance tuning and strong field confinement. When integrated with TMD monolayers, they further yield enhanced light–matter interactions, offering a versatile platform for advancing quantum photonics,
Chih‐Zong Deng   +8 more
wiley   +1 more source

Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

open access: yesScience and Technology of Advanced Materials, 2016
We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions.
Jakub Zázvorka   +5 more
doaj   +1 more source

Characterization of highly anisotropic three-dimensionally nanostructured surfaces

open access: yes, 2013
Generalized ellipsometry, a non-destructive optical characterization technique, is employed to determine geometrical structure parameters and anisotropic dielectric properties of highly spatially coherent three-dimensionally nanostructured thin films ...
Schmidt, Daniel
core   +1 more source

In-situ growth studies of sputtered ybco thin films by spectroscopic ellipsometry [PDF]

open access: yes, 1997
Using spectroscopic ellipsometry we studied in-situ the growth of off-axis sputtered YBa2Cu3O6+x thin films on (001) SrTiO3 as a function of the deposition parameters. Especially in the very first growth stage (106A cm¿2 @ 77 K) is smooth and homogeneous,
Bijlsma, M.E.   +4 more
core   +3 more sources

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