Results 41 to 50 of about 3,881 (216)
Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors
Science and Technology of Advanced Materials, 2016 We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions.
Jakub Zázvorka +5 more
doaj +1 more source
Photonics, 2021 The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics.
Najat Andam +4 more
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Single trace terahertz spectroscopic ellipsometry
Optics Express, 2019 A new technique for terahertz time-domain ellipsometry is presented. Information of reflection coefficients of the sample in two orthogonal polarizations is encoded on the same terahertz trace by using a birefringent medium. This allows for single measurement refractive index extraction without the need for a moving analyzer.
Báez-Chorro, Miguel Ángel +1 more
openaire +3 more sources
Opportunities of Semiconducting Oxide Nanostructures as Advanced Luminescent Materials in Photonics
Advanced Materials, EarlyView.The review discusses the challenges of wide and ultrawide bandgap semiconducting oxides as a suitable material platform for photonics. They offer great versatility in terms of tuning microstructure, native defects, doping, anisotropy, and micro‐ and nano‐structuring. The review focuses on their light emission, light‐confinement in optical cavities, and
Ana Cremades +7 more
wiley +1 more source
Infrared metamaterial by RF magnetron sputtered ZnO/Al:ZnO multilayers
AIP Advances, 2018 Hyperbolic metamaterials create artificial anisotropy using metallic wires suspended in dielectric media or alternating layers of a metal and dielectric (Type I or Type II).
Kevin C. Santiago +4 more
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Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films
Applied Sciences, 2022 The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color.
Chris E. Finlayson +2 more
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Rethinking Charge Transport and Recombination in Donor‐Diluted Organic Solar Cells
Advanced Materials, EarlyView.Organic solar cells with 1–45% PM6 content in Y12 were studied to link structure and charge dynamics to performance. The conductivity follows a 3D percolation model without a sharp threshold. Donor dilution preserves the photogeneration yield, but limits the fill factor due to transport resistance losses.
Chen Wang +14 more
wiley +1 more source
Ultra‐High‐Throughput Discovery of Multifunctional Polyphenolic Coatings on Droplet Microarrays
Advanced Materials, EarlyView.An ultra‐high‐throughput (UHT) combinatorial strategy enables the miniaturized synthesis and screening of ≈30 000 polyamine‐polyphenolic (PaPp) coatings using droplet microarrays (DMA). This approach reveals hundreds of previously unknown fluorescent, redox‐active, and antibacterial materials, including multifunctional, cell‐compatible surfaces ...
Vania Tanda Widyaya +11 more
wiley +1 more source
Spectroscopic ellipsometry utilizing frequency division multiplexed lasers
Communications PhysicsSpectroscopic ellipsometry (SE), which measures the thickness of thin films in a non-contact way with an accuracy of angstroms, has been widely used for optical metrology. Several types of SE are available both commercially and in research, although they
Jongkyoon Park, Yong Jai Cho, Won Chegal
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AIP Advances, 2012 We have carried out investigations aimed at understanding the mechanism responsible for a water contact angle increase of up to ten degrees and a decrease in dielectric constant in silicon modified hydrogenated amorphous carbon films compared to ...
A. A. Ogwu +2 more
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