Results 41 to 50 of about 3,818 (150)
Optical properties of Alexa™ 488 and Cy™5 immobilized on a glass surface
The absorption and emission spectra were measured for Cy™5 and Alexa™ 488 fluorophores confined on a glass surface. The data were obtained using fluorometry and spectroscopic ellipsometry.
Lili Wang +2 more
doaj +1 more source
refellips: A Python package for the analysis of variable angle spectroscopic ellipsometry data
refellips is an open-source analysis package written in Python for modelling variable angle spectroscopic ellipsometry data. The software is designed to be used in Jupyter notebook environments or simple Python scripts, facilitating reproducible research.
Hayden Robertson +5 more
doaj +1 more source
Laser-Driven Light Sources for Nanometrology Applications
Laser-driven light sources (LDLS) have ultrahigh-brightness and broad wavelength range. They are ideal radiation sources for optical metrology tools for advanced process control in semiconductor manufacturing.
Huiling Zhu, Paul Blackborow
doaj +1 more source
Measured optical constants of Pd77.5Cu6Si16.5 bulk metallic glass
Optical constants of Pd77.5Cu6Si16.5 alloy were determined experimentally using spectroscopic ellipsometry measurements on bulk specimens. Values of the complex refractive index of the glassy metallic alloys are compared to their crystalline counterparts
Lyndsey McMillon-Brown +6 more
doaj +1 more source
Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors
We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions.
Jakub Zázvorka +5 more
doaj +1 more source
The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics.
Najat Andam +4 more
doaj +1 more source
Imaging spectroscopic ellipsometry of MoS2 [PDF]
Micromechanically exfoliated mono- and multilayers of molybdenum disulfide (MoS2) are investigated by spectroscopic imaging ellipsometry. In combination with knife edge illumination, MoS2 flakes can be detected and classified on arbitrary flat and also transparent substrates with a lateral resolution down to 1-2 µm.
S, Funke +5 more
openaire +2 more sources
Infrared metamaterial by RF magnetron sputtered ZnO/Al:ZnO multilayers
Hyperbolic metamaterials create artificial anisotropy using metallic wires suspended in dielectric media or alternating layers of a metal and dielectric (Type I or Type II).
Kevin C. Santiago +4 more
doaj +1 more source
Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films
The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color.
Chris E. Finlayson +2 more
doaj +1 more source
Single trace terahertz spectroscopic ellipsometry
A new technique for terahertz time-domain ellipsometry is presented. Information of reflection coefficients of the sample in two orthogonal polarizations is encoded on the same terahertz trace by using a birefringent medium. This allows for single measurement refractive index extraction without the need for a moving analyzer.
Báez-Chorro, Miguel Ángel +1 more
openaire +3 more sources

