Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers. [PDF]
Hajduk B +3 more
europepmc +1 more source
Monitoring of the Initial Stages of Diamond Growth on Aluminum Nitride Using In Situ Spectroscopic Ellipsometry. [PDF]
Leigh W +7 more
europepmc +1 more source
Advanced Optical Characterization of PEDOT:PSS by Combining Spectroscopic Ellipsometry and Raman Scattering. [PDF]
Kong M +3 more
europepmc +1 more source
Study of Tunable Dielectric Permittivity of PBDB-T-2CL Polymer in Ternary Organic Blend Thin Films Using Spectroscopic Ellipsometry. [PDF]
Hrostea L, Bulai GA, Tiron V, Leontie L.
europepmc +1 more source
Elastic and thermo-elastic characterizations of thin resin films using colored picosecond acoustics and spectroscopic ellipsometry. [PDF]
Devos A +4 more
europepmc +1 more source
Investigations of Optical Functions and Optical Transitions of 2D Semiconductors by Spectroscopic Ellipsometry and DFT. [PDF]
Gu H, Guo Z, Huang L, Fang M, Liu S.
europepmc +1 more source
Spectroscopic Ellipsometry Studies on Solution-Processed OLED Devices: Optical Properties and Interfacial Layers. [PDF]
Gioti M.
europepmc +1 more source
Investigation of Electrochromic, Combinatorial TiO2-SnO2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. [PDF]
Ismaeel NT +3 more
europepmc +1 more source
Towards Real-Time In-Situ Mid-Infrared Spectroscopic Ellipsometry in Polymer Processing. [PDF]
Ebner A +3 more
europepmc +1 more source
Spectroscopic Ellipsometry. Spectroscopic Ellipsometry and Analysis of the Measured Data.
openaire +2 more sources

