Results 71 to 80 of about 3,881 (216)
Monitoring phase transitions in β-W thin films using ellipsometry
Understanding and monitoring phase transformations in tungsten thin films is crucial for advancing applications in spintronics, including MRAM technology.
Raid Bader +2 more
doaj +1 more source
An experimentally validated optoelectronic device model is presented to describe the efficiency and roll‐off behavior of single‐layer TADF OLEDs. By coupling charge transport, exciton dynamics, and optical outcoupling, the model reproduces the External Quantum Efficiency (EQE) across different emission layer thicknesses and temperatures, offering ...
Jawid Nikan +4 more
wiley +1 more source
Silicon Nitride Resistive Memories
Amorphous SiNx is an attractive resistance switching material for ReRAM applications due to its physicochemical properties, such as humidity resistance, low oxygen diffusivity, and is used as a metal diffusion blocker. By modifying the ratio between N and Si atoms, the microstructure of the SiNx is affected, rendering it possible to change the ...
Alexandros‐Eleftherios Mavropoulis +7 more
wiley +1 more source
Rapid, non-destructive evaluation of ultrathin WSe2 using spectroscopic ellipsometry
The utilization of tungsten diselenide (WSe2) in electronic and optoelectronic devices depends on the ability to understand and control the process-property relationship during synthesis.
Sarah M. Eichfeld +4 more
doaj +1 more source
Nonmonotonic Enhancement of Electro‐Optic Properties of Wurtzite AlN Thin Films by Sc Doping
EO coefficient, rc, for Sc‐AlN thin films in comparison with that for Mg ZnO thin films (left). Calculated electric field intensity of the fundamental mode supported by the active area that includes Sc‐AlN (right). ABSTRACT Wurtzite ferroelectrics, such as Sc‐doped AlN, have recently attracted considerable attention for their potential in realizing ...
K. Abe +11 more
wiley +1 more source
A data-fitting method based on the whale optimization algorithm (WOA) is proposed to determine the thickness and refractive index of films measured by spectroscopic ellipsometry (SE).
Liyuan Ma +8 more
doaj +1 more source
Zinc Sulfide Enabling Remarkable Surface Passivation of Crystalline Silicon
Polycrystalline ZnS films capped by Al2O3 provide outstanding surface passivation performance. The excellent lattice agreement between c‐Si and ZnS combined with a hydrogenation step result in extremely low interface state density (≈ 1×1010 cm−2 eV−1) and recombination current pre‐factor (1.0 fA/cm2), revealing a new passivation strategy for ...
Gabriel Bartholazzi +5 more
wiley +1 more source
Design of a Multiplex Sensing Platform: AFM as a Nanolithographic Tool
Coupling spectroscopic ellipsometry (SE), quartz crystal microbalance with dissipation (QCM-D), X-ray photoemission spectroscopy (XPS), and atomic force microscopy (AFM), we developed a multi-technique approach to characterize the surface immobilization ...
Silvia Maria Cristina Rotondi +3 more
doaj +1 more source
Memristors based on trimethylsulfonium (phenanthroline)tetraiodobismuthate have been utilised as a nonlinear node in a delayed feedback reservoir. This system allowed an efficient classification of acoustic signals, namely differentiation of vocalisation of the brushtail possum (Trichosurus vulpecula).
Ewelina Cechosz +4 more
wiley +1 more source
This research demonstrates that the combination of domain knowledge–based multiple regression, multi‐objective Bayesian optimization, and generative models is a suitable prediction tool for candidates of high refractive index polymers, even with the constraints in the model trained on limited data. The experimental validation can reproduce the proposed
Takuya Yokoo +3 more
wiley +1 more source

