Results 71 to 80 of about 370,378 (203)
Monitoring phase transitions in β-W thin films using ellipsometry
Understanding and monitoring phase transformations in tungsten thin films is crucial for advancing applications in spintronics, including MRAM technology.
Raid Bader +2 more
doaj +1 more source
Employing spectroscopic ellipsometry for glass coating applications [PDF]
Precise measurements of the thin films used in glass industry are important for quality glass coating requirements. Both film thickness and optical properties are critical to the heat protection or anti-reflection coating behavior.
Wagner, Thomas, Anderson, Charles
core +1 more source
Emergence of Unconventional Magnetic Order in Strain‐Engineered RuO2/TiO2 Superlattices
Epitaxial strain activates unconventional magnetism in rutile RuO2, absent in bulk or relaxed RuO2. Polarized neutron reflectometry with atomic‐layer resolution directly reveals finite magnetization confined to RuO2 layers in fully strained RuO2/TiO2 superlattices on TiO2 (110).
Seung Gyo Jeong +12 more
wiley +1 more source
Researchers developed and applied a generative artificial intelligence (AI) model to optimize epsilon‐near‐zero thin film stacks for ultra‐broadband perfect absorption of light. The fabricated AI‐designed absorber, with a total thickness of only 160 nm, experimentally demonstrated an absorption bandwidth exceeding 1000 nm while maintaining greater than
David Dang +10 more
wiley +1 more source
Rapid, non-destructive evaluation of ultrathin WSe2 using spectroscopic ellipsometry
The utilization of tungsten diselenide (WSe2) in electronic and optoelectronic devices depends on the ability to understand and control the process-property relationship during synthesis.
Sarah M. Eichfeld +4 more
doaj +1 more source
Molecular Rectification: Mechanisms, Modulation Strategies, and Device Realization
This review focuses on molecular rectification, from its fundamental mechanisms and modulation strategies to device realization. It summarizes the theoretical framework, modulation strategies, fabrication techniques, characterization methods, and modeling and simulation of molecular rectifiers, while discussing challenges and future directions for ...
Junnan Guo +8 more
wiley +1 more source
A data-fitting method based on the whale optimization algorithm (WOA) is proposed to determine the thickness and refractive index of films measured by spectroscopic ellipsometry (SE).
Liyuan Ma +8 more
doaj +1 more source
Direct water contact enhances the performance of a transparent self‐powered FTO/ZnO/NiO/AgNW/ZnO UV photodetector. Reduced surface reflection improves optical transmission, while an electric double layer at the ZnO/water interface modulates interfacial electrostatics and promotes charge separation.
Seunghee Cho +6 more
wiley +1 more source
Design of a Multiplex Sensing Platform: AFM as a Nanolithographic Tool
Coupling spectroscopic ellipsometry (SE), quartz crystal microbalance with dissipation (QCM-D), X-ray photoemission spectroscopy (XPS), and atomic force microscopy (AFM), we developed a multi-technique approach to characterize the surface immobilization ...
Silvia Maria Cristina Rotondi +3 more
doaj +1 more source
Targeted surface chemical modification prevents the accumulation of advanced glycation end products (AGEs) on implant surfaces, attenuates inflammation and fibrosis, effectively restores angiogenic activity, and improves osseointegration under diabetic conditions.
Thien Ngoc Le +13 more
wiley +1 more source

