Results 91 to 100 of about 3,818 (150)

Author Correction: Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. [PDF]

Sci Rep, 2021
Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Melendez G, Ianno N, Langell M, Schubert E, Schubert M.   +9 more
europepmc   +1 more source

Spectroscopic Ellipsometry Study of the Temperature Dependences of the Optical and Exciton Properties of MoS₂ and WS₂ Monolayers. [PDF]

Materials (Basel)
Nguyen HT, Nguyen XA, Hoang AT, Kim TJ.
europepmc   +1 more source

Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films. [PDF]

J Phys Chem B, 2020
Hajduk B, Bednarski H, Trzebicka B.
europepmc   +1 more source

Full Spectrum Electrochromic WO₃ Mechanism and Optical Modulation via Ex Situ Spectroscopic Ellipsometry: Effect of Li⁺ Surface Permeation. [PDF]

Micromachines (Basel)
Zhang B, Wang J, Jiang S, Yuan M, Chen X.   +4 more
europepmc   +1 more source

Spectroscopic ellipsometry

Oyo Buturi, 1992
openaire   +1 more source

Performance of machine learning algorithms in spectroscopic ellipsometry data analysis of ZnTiO₃ nanocomposite. [PDF]

Sci Rep
Barkhordari A, Mashayekhi HR, Amiri P, Özçelik S, Hanife F, Azizian-Kalandaragh Y.   +5 more
europepmc   +1 more source

Developing an Analysis Procedure and Dispersion Model for Pristine and W-Doped VO₂ Thin Films Using Density Functional Theory and Spectroscopic Ellipsometry. [PDF]

ACS Appl Mater Interfaces
Morris BS, Shayegan Z, Koch D, Palpant B, Chaker M.   +4 more
europepmc   +1 more source

Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe₂ Deposition. [PDF]

Materials (Basel)
Sapkota DR, Ramanujam B, Pradhan P, Alaani MAR, Shan A, Heben MJ, Marsillac S, Podraza NJ, Collins RW.   +8 more
europepmc   +1 more source

Investigating the kinetics of layer development during the color etching of low-carbon steel with in-situ spectroscopic ellipsometry. [PDF]

Heliyon
Renkó JB, Romanenko A, Bíró T, Szabó PJ, Petrik P, Bonyár A.   +5 more
europepmc   +1 more source

Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. [PDF]

Sci Rep, 2020
Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Melendez G, Ianno N, Langell M, Schubert E, Schubert M.   +9 more
europepmc   +1 more source