Results 161 to 170 of about 3,881 (216)

Developing an Analysis Procedure and Dispersion Model for Pristine and W-Doped VO₂ Thin Films Using Density Functional Theory and Spectroscopic Ellipsometry. [PDF]

ACS Appl Mater Interfaces
Morris BS, Shayegan Z, Koch D, Palpant B, Chaker M.   +4 more
europepmc   +1 more source

Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe₂ Deposition. [PDF]

Materials (Basel)
Sapkota DR, Ramanujam B, Pradhan P, Alaani MAR, Shan A, Heben MJ, Marsillac S, Podraza NJ, Collins RW.   +8 more
europepmc   +1 more source

Investigating the kinetics of layer development during the color etching of low-carbon steel with in-situ spectroscopic ellipsometry. [PDF]

Heliyon
Renkó JB, Romanenko A, Bíró T, Szabó PJ, Petrik P, Bonyár A.   +5 more
europepmc   +1 more source

Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. [PDF]

Sci Rep, 2020
Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Melendez G, Ianno N, Langell M, Schubert E, Schubert M.   +9 more
europepmc   +1 more source

Characterizing temperature-dependent optical properties of (MA_0.13FA_0.87) PbI₃ single crystals using spectroscopic ellipsometry. [PDF]

Sci Rep, 2019
Chen HW, Gulo DP, Chao YC, Liu HL.
europepmc   +1 more source

Dual-comb spectroscopic ellipsometry

Dual-comb spectroscopic ellipsometry
Spectroscopic ellipsometry is a means of investigating optical and dielectric material responses. Conventional spectroscopic ellipsometry is subject to trade-offs between spectral accuracy, resolution, and measurement time. Polarization modulation has afforded poor performance because of its sensitivity to mechanical vibrational noise, thermal ...
openaire  

Spectroscopic infra red ellipsometry

, 1989
Kroesen, G.M.W., de Wit, M.S., Creijghton, Y.L.M., Hoog, de, F.J., Schram, D.C.   +4 more
openaire   +1 more source

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Dynamic spectroscopic imaging ellipsometry

Optics Letters, 2022
A dynamic spectroscopic imaging ellipsometer (DSIE) employing a monolithic polarizing interferometer is described. The proposed DSIE system can provide spatio-spectral ellipsometric phase map data Δ(λ, x) dynamically at a speed of 30 Hz. We demonstrate the ultrafast mapping capability of the spectroscopic ellipsometer by measuring a patterned 8-inch ...
Daesuk Kim, Vamara Dembele, Sukhyun Choi, Gukhyeon Hwang, Saeid Kheiryzadehkhanghah, Chulmin Joo, Robert Magnusson   +6 more
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Roughness measurements by spectroscopic ellipsometry

Applied Optics, 1985
The surface roughnesses of fifteen well-characterized aluminum roughness standards were studied using spectroscopic ellipsometry in the spectral range from 300 to 650 nm at 70° angle of incidence. It was found that the measured ellipsometric parameters ψ and Δ qualitatively discriminated between the rms roughnesses of the specimens.
J R, Blanco, P J, McMarr, K, Vedam
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Data Analysis for Spectroscopic Ellipsometry

Thin Solid Films, 1993
Abstract The modeling of spectroscopic ellipsometry data is reviewed, and is divided into three phases. The first phase involves the calculation of the Fresnel reflection coefficients for a given layer structure; it is shown that the Abeles formalism provides the most flexibility, and can be readily related to the Berreman formalism for calculations ...
openaire   +1 more source