Results 171 to 180 of about 3,881 (216)

Spectroscopic ellipsometry of intentionally disordered superlattices

Microelectronics Journal, 2004
Abstract We characterized the electronic properties of ordered and intentionally disordered GaAs–Al x Ga 1−x As superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry in the near band-edge region. The spectra have been compared to the calculate electronic structure.
Francisco Domínguez-Adame, R. Hey, Vittorio Bellani, G. B. Parravicini, E. Diez   +4 more
openaire   +2 more sources

Study of Nematic Liquid Crystals by Spectroscopic Ellipsometry

Molecular Crystals and Liquid Crystals, 2010
Abstract— The optical characterization of liquid crystals, in a wide spectral range, is becoming a very important technical task because of their expanding applications in displays, optical telecommunications and other advanced areas of science and engineering.
Tkachenko Volodymyr, Marino Antigone, Abbate Giancarlo   +2 more
openaire   +4 more sources

Spectroscopic ellipsometry in the infrared

Infrared Physics, 1981
Abstract Infrared ellipsometry becomes simple and practicable by the combination of a photometric ellipsometer and a Fourier spectrometer. The different modes are described and the signal to noise ratio is calculated. Preliminary results for the optical constants of glass (BK7), fused quartz (SiO 2 ) and silicon are given in the range 400 −1 .
openaire   +1 more source

In-situ spectroscopic ellipsometry of HgCdTe

Journal of Electronic Materials, 1996
An in-situ spectroscopic ellipsometer has been equipped on a molecular beam epitaxy system to improve control of HgCdTe growth. Using this device, in-situ analysis of composition, growth rate, and surface cleanliness were monitored. A real time model which determined the compositional profile was used. The ellipsometer was employed to give in-situ real
J. D. Benson, A. B. Cornfeld, M. Martinka, K. M. Singley, Z. Derzko, P. J. Shorten, J. H. Dinan, P. R. Boyd, F. C. Wolfgram, B. Johs, P. He, John A. Woollam   +11 more
openaire   +1 more source

Spectroscopic ellipsometry—A perspective

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2013
Since its initial development in the early 1970s, spectroscopic ellipsometry (SE) has become the primary technique for determining optical properties of materials. In addition to the other historic role of ellipsometry, determining film thicknesses, SE is now widely used to obtain intrinsic and structural properties of homogeneous and inhomogeneous ...
openaire   +1 more source

Spectroscopic ellipsometry on 1T-TiSe2

Thin Solid Films, 1993
Abstract Ellipsometric measurements of the quasi-two-dimensional layered compound TiSe2, over the spectral range 1 ...
T. Buslaps, R.L. Johnson, G. Jungk
openaire   +1 more source

Reliability in Modeling of Spectroscopic Ellipsometry

physica status solidi (a), 2000
Spectroscopic ellipsometry (SE) [1, 2] is a powerful non-destructive technique to determine the structure of silicon-based materials such as amorphous silicon (a-Si) and hydrogenated amorphous silicon (a-Si :H). In analyzing the SE spectra, the Bruggeman effective medium approximation (EMA) [3, 4] is usually used to model a thin film as a mixture of ...
S.H. Lin, Y.C. Chan, D.P. Webb, Y.W. Lam
openaire   +1 more source

Spectroscopic Ellipsometry of CVD Graphene

ECS Meeting Abstracts, 2011
Abstract not Available.
Florence Nelson, Vimal Kamineni, Tianhao Zhang, Everett Comfort, Ji Ung Lee, Alain Diebold   +5 more
openaire   +1 more source

Characterization of Cu2SnSe3 by spectroscopic ellipsometry

Thin Solid Films, 2013
Abstract Spectroscopic ellipsometry has been used to characterize the dielectric functions of bulk Cu 2 SnSe 3 crystals, grown by modified Bridgman technique. Spectral measurements were performed at room temperature over the energy range 1.0 to 4.7 eV.
G. Gurieva, S. Levcenko, S. Schorr, M. León, R. Serna, A. Nateprov, E. Arushanov   +6 more
openaire   +1 more source

Spectroscopic ellipsometry: a historical overview

Thin Solid Films, 1998
Abstract The historical development of spectroscopic ellipsometry (SE) from the very early stages to the present will be briefly reviewed. It is shown that SE is a truly powerful technique of great interest and use to physicists, chemists, electrochemists, electrical and chemical engineers, etc., as will be evident from the following few of the many ...
openaire   +1 more source