Results 171 to 180 of about 26,661 (230)

Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films. [PDF]

J Phys Chem B, 2020
Hajduk B, Bednarski H, Trzebicka B.
europepmc   +1 more source

Full Spectrum Electrochromic WO₃ Mechanism and Optical Modulation via Ex Situ Spectroscopic Ellipsometry: Effect of Li⁺ Surface Permeation. [PDF]

Micromachines (Basel)
Zhang B, Wang J, Jiang S, Yuan M, Chen X.   +4 more
europepmc   +1 more source

Spectroscopic Ellipsometry of MoO3-x

, 2016
Intermediate band solar cells (IBSC) has a great potential to increase the efficiency of solar cells and reduce the costs of the generated electricity. To realize IBSC that contain one or more sub-band gap in the main band gap of the semiconductor needs to be developed. In this master thesis, non-destructive spectroscopic ellipsometry (SE) measurements
openaire   +1 more source

Performance of machine learning algorithms in spectroscopic ellipsometry data analysis of ZnTiO₃ nanocomposite. [PDF]

Sci Rep
Barkhordari A, Mashayekhi HR, Amiri P, Özçelik S, Hanife F, Azizian-Kalandaragh Y.   +5 more
europepmc   +1 more source

Developing an Analysis Procedure and Dispersion Model for Pristine and W-Doped VO₂ Thin Films Using Density Functional Theory and Spectroscopic Ellipsometry. [PDF]

ACS Appl Mater Interfaces
Morris BS, Shayegan Z, Koch D, Palpant B, Chaker M.   +4 more
europepmc   +1 more source

Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe₂ Deposition. [PDF]

Materials (Basel)
Sapkota DR, Ramanujam B, Pradhan P, Alaani MAR, Shan A, Heben MJ, Marsillac S, Podraza NJ, Collins RW.   +8 more
europepmc   +1 more source

Investigating the kinetics of layer development during the color etching of low-carbon steel with in-situ spectroscopic ellipsometry. [PDF]

Heliyon
Renkó JB, Romanenko A, Bíró T, Szabó PJ, Petrik P, Bonyár A.   +5 more
europepmc   +1 more source

Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. [PDF]

Sci Rep, 2020
Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Melendez G, Ianno N, Langell M, Schubert E, Schubert M.   +9 more
europepmc   +1 more source

Temperature-dependent optical constants of monolayer MoS 2 , MoSe 2 , WS 2 , and WSe 2 : spectroscopic ellipsometry and first-principles calculations. [PDF]

Sci Rep, 2020
Liu HL, Liu HL, Yang T, Chen JH, Chen HW, Guo H, Saito R, Li MY, Li LJ.   +8 more
europepmc   +1 more source

Characterizing temperature-dependent optical properties of (MA_0.13FA_0.87) PbI₃ single crystals using spectroscopic ellipsometry. [PDF]

Sci Rep, 2019
Chen HW, Gulo DP, Chao YC, Liu HL.
europepmc   +1 more source