Results 191 to 200 of about 370,378 (203)
Some of the next articles are maybe not open access.
Use of spectroscopic ellipsometry to study Zr/Ti films on Al
Surface and Interface Analysis, 2002Herman Terryn, Tom Schram
exaly
Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 2000
Devanesan Mangalaraj +2 more
exaly
Devanesan Mangalaraj +2 more
exaly
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry
Thin Solid Films, 2008James N Hilfiker +2 more
exaly
Spectroscopic ellipsometry study of buried graphitized layers in the ion-implanted diamond
Vacuum, 2005A A Gippius, A V Khomich
exaly
Spectroscopic ellipsometry measurements of thin metal films
Surface and Interface Analysis, 2000Harland G Tompkins
exaly
Optical characterization of SnO:F films by spectroscopic ellipsometry
Journal of Non-Crystalline Solids, 2010Ferhunde Atay, Idris Akyuz, V Bilgin
exaly

