Results 191 to 200 of about 26,661 (230)
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Spectroscopic ellipsometry on 1T-TiSe2
Thin Solid Films, 1993Abstract Ellipsometric measurements of the quasi-two-dimensional layered compound TiSe2, over the spectral range 1 ...
T. Buslaps, R.L. Johnson, G. Jungk
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Spectroscopic Ellipsometry of CVD Graphene
ECS Meeting Abstracts, 2011Abstract not Available.
Florence Nelson +5 more
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Spectroscopic ellipsometry under external excitation
Thin Solid Films, 1993Abstract This contribution presents a new kind of spectroscopic ellipsometry under modulated or pulsed external excitation when the sample physical properties (such as the refractive indices or thicknesses, e.g. in a layered structure) can be changed by the absorption of the incident energy.
G. Jin +4 more
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Spectroscopic Ellipsometry of Surface Plasmons
2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2019When plasmons are excited on metal surfaces, the electron system of the investigated sample is perturbed initiating changes in the dielectric function. Revealing these changes are crucial to design plasmonic components for ultrafast nanooptical switches, sensors or plasmonic circuits.
J. Budai, Z. Papa, J. Csontos, P. Dombi
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Advances in multichannel spectroscopic ellipsometry
Thin Solid Films, 1998Abstract Since the development and perfection of automatic ellipsometers, an effort that began nearly three decades ago, spectroscopic ellipsometry (SE) has increased in popularity as a non-destructive tool for characterizing the optical properties and layered structure of bulk solids and thin films.
R.W Collins +6 more
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Spectroscopic imaging ellipsometry of graphene
SPIE Newsroom, 2013Graphene, a novel nanomaterial, was first isolated in 2004 by Novoselov and coworkers.1 It is essentially a single atomic layer of carbon, where the atoms are arranged into a hexagonal, honeycomb-like structure. This structure is the reason for graphene’s unique electronic,2 optical,3 and mechanical properties, which have attracted both fundamental and
Aleksandar Matković, Radoš Gajić
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Spectroscopic ellipsometry on lamellar gratings
Applied Surface Science, 2005Deep lamellar diffraction gratings fabricated by etching a transparent quartz plate are studied using spectroscopic ellipsometry. The rigorous coupled-wave analysis is used to calculate the optical response of the gratings. Three parameters of the rectangular profile are determined by utilizing the least-square method.
R. Antos +7 more
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Industrial applications of spectroscopic ellipsometry
Thin Solid Films, 2004Abstract In this work we develop the concept of the ‘typical’ industrial ellipsometry user, discussing his/her needs and skills, compared to the scholarly user. Following this, we will give examples of industrial problems where spectroscopic ellipsometry (SE) was used to obtain the end result.
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Spectroscopic ellipsometry with synchrotron radiation
Review of Scientific Instruments, 1989The design, construction, and performance of an automatic photometric ellipsometer with rotating analyzer for the VUV region (5–30 eV) is described. The use of a synchrotron radiation source and triple-reflection polarizers makes this new spectral region accessible to spectroscopic ellipsometry.
R. L. Johnson +4 more
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How spectroscopic ellipsometry can aid graphene technology?
Thin Solid Films, 2014We explore the effects of substrate, grain size, oxidation and cleaning on the optical properties of chemical vapor deposited polycrystalline monolayer graphene exploiting spectroscopic ellipsometry in the NIR-Vis-UV range. Both Drude-Lorentz oscillators' and point-by-point fit approaches are used to analyze the ellipsometric spectra.
Losurdo Maria +4 more
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