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P3HT:PCBM blend films phase diagram on the base of variable-temperature spectroscopic ellipsometry. [PDF]
Beilstein J Nanotechnol, 2018 Hajduk B +4 more
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Dynamic spectroscopic imaging ellipsometry
Optics Letters, 2022A dynamic spectroscopic imaging ellipsometer (DSIE) employing a monolithic polarizing interferometer is described. The proposed DSIE system can provide spatio-spectral ellipsometric phase map data Δ(λ, x) dynamically at a speed of 30 Hz. We demonstrate the ultrafast mapping capability of the spectroscopic ellipsometer by measuring a patterned 8-inch ...
Daesuk Kim +6 more
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Spectroscopic ellipsometry methods for brevetoxin detection
Talanta, 2022The spectroscopic ellipsometry (SE), and attenuated internal reflection spectroscopic ellipsometry (TIRE) are promising methods in label-free biosensing applications. An ellipsometer running under surface plasmon resonance (SPR) conditions has unique advantages over other SPR-based methods in terms of sensitivity and real-time/label-free measurement ...
Mustafa Oguzhan Caglayan +2 more
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Roughness measurements by spectroscopic ellipsometry
Applied Optics, 1985The surface roughnesses of fifteen well-characterized aluminum roughness standards were studied using spectroscopic ellipsometry in the spectral range from 300 to 650 nm at 70° angle of incidence. It was found that the measured ellipsometric parameters ψ and Δ qualitatively discriminated between the rms roughnesses of the specimens.
J R, Blanco, P J, McMarr, K, Vedam
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Photo-interferometric spectroscopic ellipsometry
Thin Solid Films, 2004Abstract Interference in an air gap between a reference surface (a glass) and the surface to measure can be used to obtain its reflectance in a robust way and also to obtain the ellipsometric parameter Δ. In the methodology proposed, there is no need to measure a reference beam.
J.C. Martinez-Antón, O. Esteban
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Multi-pass spectroscopic ellipsometry
Thin Solid Films, 2014Abstract Spectroscopic ellipsometry is an established technique, particularly useful for thickness measurements of thin films. It measures polarization rotation after a single reflection of a beam of light on the measured substrate at a given incidence angle.
Stehle, Jean-Louis +8 more
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Data Analysis for Spectroscopic Ellipsometry
Thin Solid Films, 1993Abstract The modeling of spectroscopic ellipsometry data is reviewed, and is divided into three phases. The first phase involves the calculation of the Fresnel reflection coefficients for a given layer structure; it is shown that the Abeles formalism provides the most flexibility, and can be readily related to the Berreman formalism for calculations ...
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Study of Nematic Liquid Crystals by Spectroscopic Ellipsometry
Molecular Crystals and Liquid Crystals, 2010Abstract— The optical characterization of liquid crystals, in a wide spectral range, is becoming a very important technical task because of their expanding applications in displays, optical telecommunications and other advanced areas of science and engineering.
Tkachenko Volodymyr +2 more
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Spectroscopic ellipsometry—A perspective
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2013Since its initial development in the early 1970s, spectroscopic ellipsometry (SE) has become the primary technique for determining optical properties of materials. In addition to the other historic role of ellipsometry, determining film thicknesses, SE is now widely used to obtain intrinsic and structural properties of homogeneous and inhomogeneous ...
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