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Spectroscopic ellipsometry study of buried graphitized layers in the ion-implanted diamond
Vacuum, 2005E V Zavedeev, A A Gippius
exaly
Spectroscopic ellipsometry on graphene
2010Weber, J.W., Sanden, van de, M.C.M.
openaire +1 more source
Channeled spectroscopic ellipsometry enabled by physics-informed tandem untrained neural networks
Measurement: Journal of the International Measurement ConfederationShiyuan Liu, Xiuguo Chen
exaly
Characterization of semiconductors by spectroscopic ellipsometry
Mathias Schubert +5 moreopenaire +1 more source

