Results 261 to 270 of about 304,009 (317)
Cognitive effects of methamphetamine and amphetamine withdrawal in rodents: a systematic review. [PDF]
Poorvii R +8 more
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Dynamic Modeling and Analysis for Design of Memristive and Static Random Access Memories
Yenpo Ho
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Attractor-Based Models for Sequences and Pattern Generation in Neural Circuits. [PDF]
Alvarez JL, Morrison K, Curto C.
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An Explainable Markov Chain-Machine Learning Sequential-Aware Anomaly Detection Framework for Industrial IoT Systems Based on OPC UA. [PDF]
Ghazi Y, Tabaa M, Ennaji M, Zaz G.
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Dynamic multi-objective aviation maintenance scheduling: an algorithmic framework. [PDF]
Qi L, Lv C, Zhang T, Wang Y.
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2D Materials‐Based Static Random‐Access Memory
Advanced Materials, 2022Abstract2D transition‐metal dichalcogenide semiconductors, such as MoS2 and WSe2, with adequate bandgaps are promising channel materials for ultrascaled logic transistors. This scalability study of 2D material (2DM)‐based field‐effect transistor (FET) and static random‐access memory (SRAM) cells analyzing the impact of layer thickness reveals that the ...
Chang‐Ju Liu +6 more
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A 128Kb CMOS static random-access memory
IBM Journal of Research and Development, 1991This paper describes an all-CMOS 128Kb static random-access memory (SRAM) with emitter-coupled-logic (ECL) I/O compatibility which was designed for the air-cooled Enterprise System/9000™ processors. Access time of 6.5 ns is achieved using 0.5-µm channel length and 1.0-µm minimum geometry. Pipelining and self-resetting circuit techniques permit the chip
Jeff L. Chu +2 more
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Ultraflexible Monolithic Three-Dimensional Static Random Access Memory
ACS NanoFlexible static random access memory (SRAM) plays an important role in flexible electronics and systems. However, achieving SRAM with a small footprint, high flexibility, and high thermal stability has always been a big challenge. In this work, an ultraflexible six-transistor SRAM with high integration density is realized based on a monolithic three ...
Jiaona Zhang +12 more
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Testing static and dynamic faults in random access memories
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 2003The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverage. The important class of dynamic faults, therefore, cannot be ignored any more. It is shown that conventional memory tests constructed to detect static faulty behavior of a specific defect do not necessarily detect the dynamic faulty behavior. Indeed,
Said Hamdioui +2 more
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