Results 1 to 10 of about 10,751 (237)
A Non-invasive Technique to Detect Authentic/Counterfeit SRAM Chips [PDF]
ACM Journal on Emerging Technologies in Computing Systems, 2021 Many commercially available memory chips are fabricated worldwide in untrusted facilities. Therefore, a counterfeit memory chip can easily enter into the supply chain in different formats. Deploying these counterfeit memory chips into an electronic system can severely affect security and reliability domains because of their substandard quality, poor ...
B. M. S. Bahar Talukder +2 more
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Chip-to-Chip Authentication Method Based on SRAM PUF and Public Key Cryptography [PDF]
Journal of Hardware and Systems Security, 2019 AbstractIn today’s globalized integrated circuit (IC) ecosystem, untrusted foundries are often procured to build critical systems since they offer state-of-the-art silicon with the best performance available. On the other hand, ICs that originate from trusted fabrication cannot match the same performance level since trusted fabrication is often ...
Ioannis Karageorgos +3 more
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Wafer Burn-in Method of SRAM for Multi Chip Package [PDF]
Transactions on Electrical and Electronic Materials, 2004 This paper presents the improved bum-in method for the reliability of SRAM in Multi Chip Package (MCP). Semiconductor reliability is commonly improved through the bum-in process. Reliability problem is more significant in MCP that includes over two chips in a package, because the failure of one chip (SRAM) has a large influence on the yield and quality
Hoo-Sung Kim +2 more
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Single-Chip Motes and SRAM PUF: Feasibility Study
2024 IEEE Workshop on Crystal-Free/-Less Radio and System-Based Research for IoT (CrystalFreeIoT)Physically unclonable functions (PUFs) are used as low-cost cryptographic primitives that extract key material from manufacturing variabilities of a device. All microcontrollers have on-chip SRAM; the power-up state of SRAM cells provides one way of obtaining a random output. However, not every SRAM can be used as a PUF.
Sara Faour +6 more
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Wafer Burn-in Method for SRAM in Multi Chip Package [PDF]
Journal of the Korean Institute of Electrical and Electronic Material Engineers, 2005 This paper presents the improved burn-in method for the reliability of SRAM in Multi Chip Package (MCP). Semiconductor reliability is commonly improved by the burn-in process. Reliability Problem is very significant in the MCP which includes over two chips in a package because the failure of one SRAM chip has a large influence on the yield and quality ...
Jee-Young Yoon +3 more
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Eliminating energy of same-content-cell-columns of on-chip SRAM arrays
IEEE/ACM International Symposium on Low Power Electronics and Design, 2011 Conference code ...
Bushra Ahsan +5 more
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Ultra-Low Power and Reliable SRAM for Systems-on-Chip [PDF]
, 2017 The number of ubiquitous sensors has increased to more than double the human population and is expected to continue growing in the future. The pervasive use of sensors for applications such as personal healthcare and the Internet of Things (IoT) presents a growing sustainability challenge concerning the availability and accessibility of power sources ...
Harsh N. Patel
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Error reduction of SRAM-based physically unclonable function for chip authentication [PDF]
International Journal of Information Security, 2023 Moon‐Seok Kim +6 more
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Lightweight Fault Tolerance in SRAM Based On-Chip Memories
, 2018 The reliability of memory subsystem is fast becoming a concern in computer architecture and system design. From on-chip embedded memories in Internet-of-Things (IoT) devices and on-chip caches to off-chip main memories, they have become the limiting factor in reliability of computing systems.
Irina Alam
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Performance Analysis Of SRAM and Dram in Low Power Application [PDF]
E3S Web of Conferences, 2023 All electronic systems must function quickly in the current environment, and 80 percent of electronic chips have memory components. SRAM (Static Random Access Memory) has thus become a major key component in many VLSI Chips in order to reduce the size of
Yuvaraj S. +5 more
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