Results 11 to 20 of about 546 (170)

Chip-to-Chip Authentication Method Based on SRAM PUF and Public Key Cryptography [PDF]

open access: yesJournal of Hardware and Systems Security, 2019
AbstractIn today’s globalized integrated circuit (IC) ecosystem, untrusted foundries are often procured to build critical systems since they offer state-of-the-art silicon with the best performance available. On the other hand, ICs that originate from trusted fabrication cannot match the same performance level since trusted fabrication is often ...
Ioannis Karageorgos   +3 more
openaire   +1 more source

Reliable SRAM using NAND‐NOR Gate in beyond‐CMOS QCA technology

open access: yesIET Computers & Digital Techniques, 2021
The rise in complementary metal‐oxide semiconductor (CMOS) limitations has urged the industry to shift its focus towards beyond‐CMOS technologies to stay in race with Moore’s law.
Marshal Raj   +2 more
doaj   +1 more source

Deep Q-Learning with Bit-Swapping-Based Linear Feedback Shift Register fostered Built-In Self-Test and Built-In Self-Repair for SRAM

open access: yesMicromachines, 2022
Including redundancy is popular and widely used in a fault-tolerant method for memories. Effective fault-tolerant methods are a demand of today’s large-size memories.
Mohammed Altaf Ahmed, Suleman Alnatheer
doaj   +1 more source

Algorithm for matching physical and logical addressing in memory chips using laser sources

open access: yesБезопасность информационных технологий, 2020
The paper presents the developed algorithm for correlating the physical and logical addressing in memory chips using laser radiation sources to determine the nature of failures in radiation tests.
Viacheslav A. Chepov   +2 more
doaj   +1 more source

Design of 10T SRAM cell with improved read performance and expanded write margin

open access: yesIET Circuits, Devices and Systems, 2021
The need of genuine processors operation improvement cultivates the necessity for reliable, low power and fast memories. Several challenges follow this improvement at lower technology nodes.
Ashish Sachdeva, V. K. Tomar
doaj   +1 more source

Automatic diagnosis of single fault in interconnect testing of SRAM‐based FPGA

open access: yesIET Computers & Digital Techniques, 2021
Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period is vital particularly in reducing the dead time of critical applications that are running on FPGAs.
T. Nirmalraj   +2 more
doaj   +1 more source

Marmote SDR: Experimental Platform for Low-Power Wireless Protocol Stack Research

open access: yesJournal of Sensor and Actuator Networks, 2013
Over the past decade, wireless sensor network research primarily relied on highly-integrated commercial off-the-shelf radio chips. The rigid silicon implementation of the radio stack restricted access to the lower layers; thus, research focused mainly on
Ákos Lédeczi   +3 more
doaj   +1 more source

DESIGN OF LOW POWER 8T SRAM WITH SCHMITT TRIGGER LOGIC [PDF]

open access: yesJournal of Engineering Science and Technology, 2014
Static Random Access Memory (SRAM) has become a key element in modern VLSI systems. In this paper, a low power design of 8 Transistor SRAM cell with Schmitt Trigger (ST) logic is proposed.
A. KISHORE KUMAR   +3 more
doaj  

FPGA-based fault injection design for 16K-point FFT processor

open access: yesThe Journal of Engineering, 2019
There are a number of satellites working in the harsh space environment. The charged particles in space may strike the electron devices causing the undesired influences, such as soft errors in memory devices or permanent damage in hardware circuits ...
Chuang-An Mao   +4 more
doaj   +1 more source

A Soft Error Self-Resilience Radiation-Hardened 14T SRAM for Aerospace Applications

open access: yesIEEE Access
Various charged particles in space threaten memory circuit integrity and dependability, including photons, alpha particles, and high-energy ions outside the Low Earth Orbit region.
Guguloth Anjaneyulu   +7 more
doaj   +1 more source

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