Results 21 to 30 of about 10,751 (237)

A PUF-and biometric-based lightweight hardware solution to increase security at sensor nodes [PDF]

open access: yes, 2018
Security is essential in sensor nodes which acquire and transmit sensitive data. However, the constraints of processing, memory and power consumption are very high in these nodes. Cryptographic algorithms based on symmetric key are very suitable for them.
Arcenegui, Javier   +3 more
core   +1 more source

Transpose-free variable-size FFT accelerator based on-chip SRAM

open access: diamondIEICE Electronics Express, 2014
Lei Guo   +4 more
openalex   +3 more sources

Reliable SRAM using NAND‐NOR Gate in beyond‐CMOS QCA technology

open access: yesIET Computers & Digital Techniques, 2021
The rise in complementary metal‐oxide semiconductor (CMOS) limitations has urged the industry to shift its focus towards beyond‐CMOS technologies to stay in race with Moore’s law.
Marshal Raj   +2 more
doaj   +1 more source

Deep Q-Learning with Bit-Swapping-Based Linear Feedback Shift Register fostered Built-In Self-Test and Built-In Self-Repair for SRAM

open access: yesMicromachines, 2022
Including redundancy is popular and widely used in a fault-tolerant method for memories. Effective fault-tolerant methods are a demand of today’s large-size memories.
Mohammed Altaf Ahmed, Suleman Alnatheer
doaj   +1 more source

Hyperdrive: A Multi-Chip Systolically Scalable Binary-Weight CNN Inference Engine [PDF]

open access: yes, 2019
Deep neural networks have achieved impressive results in computer vision and machine learning. Unfortunately, state-of-the-art networks are extremely compute and memory intensive which makes them unsuitable for mW-devices such as IoT end-nodes ...
Andri, Renzo   +3 more
core   +2 more sources

Algorithm for matching physical and logical addressing in memory chips using laser sources

open access: yesБезопасность информационных технологий, 2020
The paper presents the developed algorithm for correlating the physical and logical addressing in memory chips using laser radiation sources to determine the nature of failures in radiation tests.
Viacheslav A. Chepov   +2 more
doaj   +1 more source

Facility for fast neutron irradiation tests of electronics at the ISIS spallation neutron source [PDF]

open access: yes, 2008
The VESUVIO beam line at the ISIS spallation neutron source was set up for neutron irradiation tests in the neutron energy range above 10 MeV. The neutron flux and energy spectrum were shown, in benchmark activation measurements, to provide a neutron ...
A. Paccagnella   +10 more
core   +2 more sources

Design of 10T SRAM cell with improved read performance and expanded write margin

open access: yesIET Circuits, Devices and Systems, 2021
The need of genuine processors operation improvement cultivates the necessity for reliable, low power and fast memories. Several challenges follow this improvement at lower technology nodes.
Ashish Sachdeva, V. K. Tomar
doaj   +1 more source

PROGRAPE-1: A Programmable, Multi-Purpose Computer for Many-Body Simulations [PDF]

open access: yes, 1999
We have developed PROGRAPE-1 (PROgrammable GRAPE-1), a programmable multi-purpose computer for many-body simulations. The main difference between PROGRAPE-1 and "traditional" GRAPE systems is that the former uses FPGA (Field Programmable Gate Array ...
Fukushige, Toshiyuki   +3 more
core   +4 more sources

Automatic diagnosis of single fault in interconnect testing of SRAM‐based FPGA

open access: yesIET Computers & Digital Techniques, 2021
Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period is vital particularly in reducing the dead time of critical applications that are running on FPGAs.
T. Nirmalraj   +2 more
doaj   +1 more source

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