Results 131 to 140 of about 5,282 (241)

Statistically Resolving Thickness‐Dependent Electrical Characteristics in Multilayer‐MoS2 Transistors

open access: yesAdvanced Functional Materials, Volume 36, Issue 45, 5 June 2026.
A large number of MoS2 flakes were screened to obtain high‐quality flakes based on optical intensities in R, G, and B channel images. The flakes were classified from Level 1 to 6 based on optical intensities in the R, G, and B channel images. Low‐quality flake exhibited wrinkled, folded, or overlapped features, while high‐quality displayed a neat ...
Sanghyun Lee   +11 more
wiley   +1 more source

Achieving Near-Ideal Subthreshold Swing in P-Type WSe2 Field-Effect Transistors

open access: yes
Publisher Copyright: © 2024 The Authors. Advanced Electronic Materials published by Wiley-VCH GmbH. | openaire: EC/H2020/872049/EU//IPN-Bio | openaire: EC/H2020/834742/EU//ATOPThe pursuit of near-ideal subthreshold swing (SS) ≈ 60 mV dec−1 is a primary ...
Choi, Hyungyu   +8 more
core   +1 more source

Evolution of Materials and Device Stacks for HfO2‐Based Ferroelectric Memories

open access: yesAdvanced Materials Interfaces, Volume 13, Issue 11, 9 June 2026.
This review summarizes engineering strategies for HfO2 based ferroelectric memories with focus on FeCAP and FeFET structures. It describes how dopant design, stress effects, and interface engineering improve the bulk ferroelectric response. It further discusses how channel engineering supports reliable memory characteristics and scalable integration ...
Eunjin Kim, Jiyong Woo
wiley   +1 more source

Ultimate-scaled one-dimensional transistors: Surpassing the subthreshold swing limit

open access: yesComputational Materials Today
The continuous miniaturization of field-effect transistors (FETs) has propelled microprocessors to unprecedented levels of integration. However, further scaling encounters a critical trade-off between integration density and power efficiency.
Weiming Zhang   +4 more
doaj   +1 more source

Utilizing reverse short-channel effect for optimal subthreshold circuit design

open access: yes, 2007
The impact of the reverse short-channel effect (RSCE) on device current is stronger in the subthreshold region due to reduced drain-induced barrier lowering (DIBL) and the exponential
Kim, Tony Tae-Hyoung   +3 more
core   +1 more source

Hydrogen‐State‐Engineered Oxide Semiconductor Channels Enabling Reliable 2T0C DRAM Operation

open access: yesAdvanced Electronic Materials, Volume 12, Issue 11, 8 June 2026.
We introduce a three‐step hydrogen annealing method for oxide semiconductor devices that modulates hydrogen incorporation and its passivation behavior. Consequently, interface traps are suppressed, whereas the mobility, reliability, and data retention of the IGO‐based 2T0C DRAM are simultaneously improved.
Jun‐Yeoub Lee   +5 more
wiley   +1 more source

Modeling and Simulation of Subthreshold Swing and Subthreshold Current in Short Channel Fully-Depleted UTB Recessed Source/Drain SOI MOSFETs

open access: yes, 2016
Fully Depleted Silicon-On-Insulator is a promising technology but there were limitations in it due to the ultra thin Silicon body which increases the series resistance. So research was done to find new devices to overcome this limitation. One such device
Prasada, Kiranmayi
core  

Solution‐Processed Tunable Spectral Response Photodetectors Enabled by Acidochromic Polymers

open access: yesAdvanced Electronic Materials, Volume 12, Issue 11, 8 June 2026.
Tunable spectral response photodetectors have been fabricated by using acidochromic polymers in photodiode and phototransistor geometries with organic/inorganic semiconductor heterojunctions. The spectral response of the photodetector has been tuned from the visible to the NIR region by using vapor‐phase trifluoroacetic acid (TFA) in a reversible way ...
Pijush Kanti Aich   +5 more
wiley   +1 more source

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