Oxide induced degradation in MoS<sub>2</sub> field-effect transistors. [PDF]
Ducry F +5 more
europepmc +1 more source
Fabrication and Electrical Characterization of MgZnO/ZTO Thin-Film Transistors. [PDF]
Hao Y +9 more
europepmc +1 more source
Characterization and understanding of subthreshold swing of Si MOSFETs at cryogenic temperatures
openaire +1 more source
Performance analysis of electrostatic and transport characteristics of underlap-engineered gate-all-around carbon nanotube (CNT) FETs for nanoelectronics circuitry applications. [PDF]
Bose SJ, Dhar RS, Hussein MI, Awwad F.
europepmc +1 more source
Study of dielectric modulated dual source triple gate TFET for biosensing applications. [PDF]
Cui G, Xu H.
europepmc +1 more source
Performance Analysis and Optimization of an InGaAs/GaAsSb Heterojunction Dopingless Tunnel FET with a Heterogate Dielectric. [PDF]
Huang J +5 more
europepmc +1 more source
Large-area two-dimensional MoO<sub>3</sub> as a high-κ dielectric for van der Waals integration. [PDF]
Hu Z +28 more
europepmc +1 more source
All-2D vertical metal-semiconductor field-effect transistor with sub-10 nm channel and contact lengths. [PDF]
Zhang Y +5 more
europepmc +1 more source
Benchmarking of Ultrascaled Monolayer Halogenated Borophene Transistors: A Comprehensive First-Principles Quantum Transport Study. [PDF]
Zhang S +5 more
europepmc +1 more source

