Results 201 to 210 of about 5,000 (223)

NUMERICAL SIMULATION OF SET USING TCAD

i-manager’s Journal on Electronics Engineering, 2021
ASHRAF JAVED, SINGHAL TARUN, K. LAMBA VIJAY   +2 more
openaire   +1 more source

Device Simulation Process on TCAD

2023
Abhay Pratap Singh, R.K. Baghel, Sukeshni Tirkey   +2 more
openaire   +1 more source

Simulation of BioGFET sensors using TCAD

Solid-State Electronics, 2023
Elsa Fuente-Zapico, Paula Martínez-Mazon, Jose Carlos Galdón, Carlos Márquez, Carlos Navarro, Luca Donetti, Carlos Sampedro, Francisco Gamiz   +7 more
openaire   +1 more source

A unified model for TCAD simulation of the charge generated in semiconductors by low-energy alpha particles and protons

Microelectronics Reliability, 2022
M Ciappa
exaly  

Study of parasitic oscillation of a multi-chip SiC MOSFET circuit based on a signal flow graph model by TCAD simulation

Solid-State Electronics, 2021
Ichiro Omura
exaly  

Open source software possibilities for tcad simulation

Электронная техника Серия 3 Микроэлектроника
The capabilities and limitations of open source software for TCAD simulation are considered. Analysis showed that the Suprem4-GS program and the ViennaPS library are available for two-dimensional technological modeling. There is a choice of programs for device modeling.
openaire   +1 more source

Prediction of highly scaled hydrogen-terminated diamond MISFET performance based on calibrated TCAD simulation

Diamond and Related Materials, 2017
Hiu Yung Wong
exaly  

TCAD simulation of SOI TFETs and calibration of non-local band-to-band tunneling model

Microelectronic Engineering, 2012
Surya Shankar Dan, Cyrille Le Royer, Wladek Grabinski   +2 more
exaly  

Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization

IEEE Transactions on Electron Devices, 2015
Andrew R Brown, Campbell Millar, Razaidi Hussin   +2 more
exaly  

TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices

Microelectronics Reliability, 2017
K Mukherjee, A Curutchet, N Malbert
exaly