Results 221 to 223 of about 5,000 (223)

TCAD simulation methodology of total ionizing dose effects for PDSOI transistor with a hump characteristic

Solid-State Electronics
Neil Rostand, S Martinie
exaly  

Idss failure investigated by SIMS profiling and TCAD simulation

2014
Z Q Mo, S P Zhao, Jeffrey Lam
exaly  

Optimization of RF-22nm FDSOI figures of merit with 3D TCAD simulation

2017
P Scheiblin, J Mazurier, D Harame
exaly