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Collected Charge Analysis for a New Transient Model by TCAD Simulation in 90 nm Technology
IEEE Transactions on Nuclear Science, 2010Laurent Art +2 more
exaly
TCAD simulations for radiation-tolerant silicon sensors
Proceedings of The 32nd International Workshop on Vertex Detectors — PoS(VERTEX2023)Morozzi A. +5 more
openaire +2 more sources
Simulation Model Predicts Cost Savings from Colorectal Cancer Screening
Ca-A Cancer Journal for Clinicians, 2010exaly
Session 09-B TCAD: Simulation approaches II
2010 International Conference on Simulation of Semiconductor Processes and Devices, 2010openaire +1 more source
Session 08-B TCAD: Simulation approaches I
2010 International Conference on Simulation of Semiconductor Processes and Devices, 2010openaire +1 more source