Results 11 to 20 of about 166,663,244 (286)

Molecular detection of per- and polyfluoroalkyl substances in water using time-of-flight secondary ion mass spectrometry [PDF]

open access: yesFrontiers in Chemistry, 2023
Detection of per- and polyfluoroalkyl substances (PFASs) is crucial in environmental mitigation and remediation of these persistent pollutants. We demonstrate that time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a viable technique to analyze
Xiao-Ying Yu   +7 more
doaj   +2 more sources

The localization of the alkaloids in Coptis chinensis rhizome by time-of-flight secondary ion mass spectrometry [PDF]

open access: yesFrontiers in Plant Science, 2022
BackgroundUnderstanding the spatial distribution of active compounds can effectively evaluate the quality of decoction pieces of traditional Chinese medicine (TCM).
Fan He   +12 more
doaj   +2 more sources

Time-of-flight secondary ion mass spectrometry fragment regularity in gallium-doped zinc oxide thin films [PDF]

open access: yesScientific Reports, 2021
Time-of-flight secondary ion mass spectrometry fragment analysis remains a challenging task. The fragment appearance regularity (FAR) rule is particularly useful for two-element compounds such as ZnO.
K. G. Saw, S. R. Esa
doaj   +2 more sources

Unlocking the potential of battery technologies through Time-of-Flight Secondary Ion Mass Spectrometry [PDF]

open access: yesScience and Technology of Advanced Materials
In response to the evolving demands in energy storage, the review underscores the critical need for ongoing research in battery technology, specifically centred to indispensable role of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) which aims
Prince Sharma   +3 more
doaj   +2 more sources

Quantitative Study of Spodumene by Time-of-Flight Secondary Ion Mass Spectrometry (tof-SIMS) [PDF]

open access: yesMolecules
In this paper, the quantitative feasibility of time-of-flight secondary ion mass spectrometry (tof-SIMS) for major and minor elements in spodumene was evaluated in terms of calibration method with a matrix-matched or non-matrix-matched standard and an ...
Xijuan Tan
doaj   +2 more sources

Time-of-Flight Secondary Ion Mass Spectrometry Coupled with Unsupervised Methods for Advanced Saffron Authenticity Screening [PDF]

open access: yesFoods
Saffron, renowned for its aroma and flavor, is susceptible to adulteration due to its high value and demand. Current detection methods, including ISO standards, often fail to identify specific adulterants such as safflower or turmeric up to 20% (w/w ...
Elisabetta De Angelis   +4 more
doaj   +2 more sources

Time‐of‐Flight Secondary Ion Mass Spectrometry Revealing the Organocatalyst Distribution in Functionalized Silica Monoliths [PDF]

open access: yesChemistryOpen
Hierarchically porous monolithic silica shows promise as a carrier material for immobilized organocatalysts. Conventional analysis usually includes physisorption, infrared spectroscopy and elemental analysis, among others, to elucidate the pore space and
Raoul D. Brand   +3 more
doaj   +2 more sources

Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging [PDF]

open access: yesNano Convergence, 2018
Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies. This technique is based on high spatial resolution (50–100 nm), high surface sensitivity (1–2 nm top-layer), and ...
Sohee Yoon, Tae Geol Lee
doaj   +2 more sources

Automated Peak Annotation in Time-of-Flight Secondary Ion Mass Spectrometry via a Physics-Informed Probabilistic Framework [PDF]

open access: yesMolecules
Peak annotation in Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a persistent bottleneck that typically requires the manual assignment of chemical formulas to hundreds of fragment ion peaks per spectrum.
Jiahua Chen   +6 more
doaj   +2 more sources

Time of flight secondary ion mass spectrometry imaging of contaminant species in chemical vapour deposited graphene on copper [PDF]

open access: yesBeilstein Journal of Nanotechnology
Time of flight secondary ion mass spectrometry (ToF-SIMS) was used to probe the chemistry of graphene grown on copper foil substrates by chemical vapour deposition (CVD) under various growth conditions.
Barry Brennan   +4 more
doaj   +2 more sources

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