Results 31 to 40 of about 166,663,244 (286)

Time-of-Flight Secondary Ion Mass Spectrometry [PDF]

Microscopy Today, 2011
The properties of many modern products are not only governed by their surface morphology and structure but also by their surface chemistry. For example, in some cases a contamination of less than a monolayer of molecules can be responsible for the failure of a coating with all its consequences (aesthetics, protection, life time, and so on). Other areas
openaire   +1 more source

Degrees of freedom effect on fragmentation in tandem mass spectrometry of singly charged supramolecular aggregates of sodium sulfonates [PDF]

, 2013
The characteristic collision energy (CCE) to obtain 50% fragmentation of positively and negatively single charged non-covalent clusters has been measured.
TURCO LIVERI, Vincenzo, Indelicato, S, Drahos, László, Liveri, Vincenzo Turco, Drahos, L, TuriàK, L, Indelicato, Serena, Vèkey, K, Vékey, Károly, Turiák, Lilla, Bongiorno, David, Indelicato, Sergio, Ceraulo, Leopoldo   +12 more
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Lipid mapping in human dystrophic muscle by cluster-time-of-flight secondary ion mass spectrometry imaging

Journal of Lipid Research, 2008
Human striated muscle samples, from male control and Duchenne muscular dystrophy-affected children, were subjected to cluster-time-of-flight secondary ion mass spectrometry (cluster-ToF-SIMS) imaging using a 25 keV Bi3+ liquid metal ion gun under static ...
Nora Tahallah, Alain Brunelle, Sabine De La Porte, Olivier Laprévote   +3 more
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Enhancement of ion intensity in time-of-flight secondary-ionization mass spectrometry [PDF]

Journal of the American Society for Mass Spectrometry, 1996
Enhancement of ion intensity in static secondary-ionization mass spectrometry (SIMS) has been achieved by using a matrix-assisted sample preparation technique. Previous investigations of polymers and biomolecules by SIMS indicated that secondary-ion (SI) yield is dependent on substrate coverage.
Nicola, Anthony J., Muddiman, David C., Hercules, David M.   +2 more
openaire   +2 more sources

Determining the order of deposition of natural latent fingerprints and laser printed ink using chemical mapping with secondary ion mass spectrometry [PDF]

, 2013
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) chemical mapping was used to investigate the order of deposition of natural latent fingerprints and laser printed ink on paper.
Jesus Ojeda Ledo, Jones, Benjamin, Jones, B J, Ojeda, Jesus J, Attard Montalto, N, Attard Montalto, Nicola, Ojeda, J J   +6 more
core   +1 more source

Data on TOF-SIMS analysis of Cu2+, Co2+ and Cr3+ doped calcium phosphate cements

Data in Brief, 2017
This article contains data of time of flight secondary ion mass spectrometry (TOF-SIMS) analysis of brushite-forming calcium phosphate cements doped with biologically active metal ions.
Anja Henß, Martha Schamel, Uwe Gbureck, Michael Gelinsky, Anja Lode   +4 more
doaj   +1 more source

COSIMA data analysis using multivariate techniques [PDF]

Geoscientific Instrumentation, Methods and Data Systems, 2015
We describe how to use multivariate analysis of complex TOF-SIMS (time-of-flight secondary ion mass spectrometry) spectra by introducing the method of random projections.
J. Silén, H. Cottin, M. Hilchenbach, J. Kissel, H. Lehto, S. Siljeström, K. Varmuza   +6 more
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Data on step-by-step atomic force microscopy monitoring of changes occurring in single melanoma cells undergoing ToF SIMS specialized sample preparation protocol

Data in Brief, 2016
Data included in this article are associated with the research article entitled ‘Protocol of single cells preparation for time-of-flight secondary ion mass spectrometry’ (Bobrowska et al., 2016 in press) [1].
J. Bobrowska, J. Pabijan, J. Wiltowska-Zuber, B.R. Jany, F. Krok, K. Awsiuk, J. Rysz, A. Budkowski, M. Lekka   +8 more
doaj   +1 more source

In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum

Nanomaterials, 2022
Recent developments in nanoprinting using focused electron beams have created a need to develop analysis methods for the products of electron-induced fragmentation of different metalorganic compounds.
Jakub Jurczyk, Lex Pillatsch, Luisa Berger, Agnieszka Priebe, Katarzyna Madajska, Czesław Kapusta, Iwona B. Szymańska, Johann Michler, Ivo Utke   +8 more
doaj   +1 more source

Characterization of Oil Spots on Black-Glazed Teabowl Made in Song Dynasty by Time-of-Flight Secondary Ion Mass Spectrometry [PDF]

Zhipu Xuebao, 2023
The ancient porcelain is the treasure of Chinese civilization. In this paper, multiple surface analysis tools were applied to characterize the attractive silvery bright spots on the glaze of black-glazed tea bowl fragment.
XU Zi-qi1,2, ZHAO Xuan-he1,2, LIANG Han-dong1,2, LI Zhan-ping3, TIE Cai1,4   +4 more
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