Results 31 to 40 of about 76,098 (279)
Time-of-Flight Secondary Ion Mass Spectrometry [PDF]
The properties of many modern products are not only governed by their surface morphology and structure but also by their surface chemistry. For example, in some cases a contamination of less than a monolayer of molecules can be responsible for the failure of a coating with all its consequences (aesthetics, protection, life time, and so on). Other areas
openaire +1 more source
COSIMA data analysis using multivariate techniques [PDF]
We describe how to use multivariate analysis of complex TOF-SIMS (time-of-flight secondary ion mass spectrometry) spectra by introducing the method of random projections.
J. Silén +6 more
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PIXE and ToF-SIMS analysis of streaker samplers filters [PDF]
This paper presents methodological innovations introduced in the characterisation of urban aerosol collected in Italy in a recent campaign. Two complementary ion beam analysis (IBA) techniques were used to analyse Nuclepore filters used in continuous ...
Adriaens, Mieke +9 more
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Enhancement of ion intensity in time-of-flight secondary-ionization mass spectrometry [PDF]
Enhancement of ion intensity in static secondary-ionization mass spectrometry (SIMS) has been achieved by using a matrix-assisted sample preparation technique. Previous investigations of polymers and biomolecules by SIMS indicated that secondary-ion (SI) yield is dependent on substrate coverage.
Nicola, Anthony J. +2 more
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Human striated muscle samples, from male control and Duchenne muscular dystrophy-affected children, were subjected to cluster-time-of-flight secondary ion mass spectrometry (cluster-ToF-SIMS) imaging using a 25 keV Bi3+ liquid metal ion gun under static ...
Nora Tahallah +3 more
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Data on TOF-SIMS analysis of Cu2+, Co2+ and Cr3+ doped calcium phosphate cements
This article contains data of time of flight secondary ion mass spectrometry (TOF-SIMS) analysis of brushite-forming calcium phosphate cements doped with biologically active metal ions.
Anja Henß +4 more
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Ultrafast carrier dynamics on Si surfaces studied by femtosecond time-resolved two-photon photoelectron spectroscopy [PDF]
Secondary Ion Mass spectrometry (SIMS) has been generally used in the field of material sciences. In recent years, it has also been applied for molecular imaging of biological samples.
Aoki, T +7 more
core +1 more source
Data included in this article are associated with the research article entitled ‘Protocol of single cells preparation for time-of-flight secondary ion mass spectrometry’ (Bobrowska et al., 2016 in press) [1].
J. Bobrowska +8 more
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Recent developments in nanoprinting using focused electron beams have created a need to develop analysis methods for the products of electron-induced fragmentation of different metalorganic compounds.
Jakub Jurczyk +8 more
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Characterization of Oil Spots on Black-Glazed Teabowl Made in Song Dynasty by Time-of-Flight Secondary Ion Mass Spectrometry [PDF]
The ancient porcelain is the treasure of Chinese civilization. In this paper, multiple surface analysis tools were applied to characterize the attractive silvery bright spots on the glaze of black-glazed tea bowl fragment.
XU Zi-qi1,2 +4 more
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