Results 21 to 30 of about 166,663,244 (286)

Microscope imaging by time-of-flight secondary ion mass spectrometry [PDF]

Microscopy Microanalysis Microstructures, 1992
The concept of Secondary Ion Microscopy, introduced by Castaing et al. [1], is applied to a direct imaging time-of-flight (TOF) mass spectrometer. The ion optical configuration for a particular [2] stigmatic imaging TOF mass spectrometer is reviewed. A number of fundamental factors influencing the mass resolution in any TOF spectrometer are discussed ...
Bruno W. Schueler
openaire   +2 more sources

Dynamics of Molecules Observed at Crude-Oil-Gas Interfaces by Time-of-Flight Secondary Ion Mass Spectrometry Imaging. [PDF]

J Am Soc Mass Spectrom, 2020
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging provides molecular speciation at the micrometer scale, while the penetration depth of the primary ion beam is limited to the top-layers of a sample. These combined properties make TOF-SIMS
Arisz PWF, Pureveen JBM, Heeren RMA.
europepmc   +2 more sources

Effect and mechanism of organic depressant on the hydrophobicity of chalcopyrite and pyrite under weakly alkaline environment

Journal of Materials Research and Technology, 2021
In a chalcopyrite and pyrite flotation system, the effect and mechanism of organic depressant sodium dimethyl dithiocarbamate on the hydrophobicity of chalcopyrite and pyrite were studied.
Xu Bai, Jian Liu, Shuming Wen, Yilin Lin
doaj   +1 more source

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories

CHIMIA, 2022
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged ...
Johanna Marin Carbonne, Andras Kiss, Anne-Sophie Bouvier, Anders Meibom, Lukas Baumgartner, Thomas Bovay, Florent Plane, Stephane Escrig, Daniela Rubatto   +8 more
doaj   +1 more source

Effect of benzotriazole on the existing pits of copper tube in fire sprinkler system

Heliyon, 2023
In this paper, two leaking tubes were investigated among copper tubes injected with 200 and 400 ppm benzotriazole after 8 years of usage. The electrochemical tests were conducted in simulated pit-out and pit-in environments (i.e., regions outside and ...
Eun-Ha Park, Sang-Jin Ko, Jung-Gu Kim
doaj   +1 more source

Ion Imaging of Native Protein Complexes Using Orthogonal Time-of-Flight Mass Spectrometry and a Timepix Detector [PDF]

, 2021
Native mass spectrometry (native MS) has emerged as a powerful technique to study the structure and stoichiometry of large protein complexes. Traditionally, native MS has been performed on modified time-of-flight (TOF) systems combined with detectors ...
Heck, A.J.R. (Albert), Heck, A.J.R., Heeren, Ron M A, Spaanderman, D.-J. (Dirk-Jan), Spaanderman, Dirk-Jan, Byelov, D. (Dimitry), Mathew, A., Dyachenko, Andrey, Porta Siegel, Tiffany, Dyachenko, A., Mathew, Anjusha, Spaanderman, D.J., Buijs, R. (Ronald), Heeren, R.M.A. (Ron), Byelov, D., Mathew, A. (Anjusha), van der Horst, J., Heck, Albert J R, Heeren, R.M.A., Siegel, T.P. (Tiffany Porta), Giskes, F.G. (Frans), Buijs, R., Eijkel, Gert B, Ellis, Shane R, Eijkel, G.B. (Gert), Dyachenko, A. (Andrey), Giskes, F., Eijkel, G.B., Siegel, T.P., Giskes, Frans, Horst, J. (Jerre) van der, Ellis, S.R. (Shane), Byelov, Dimitry, van der Horst, Jerre, Ellis, S.R., Buijs, Ronald   +35 more
core   +1 more source

Spatiotemporal lipid profiling during early embryo development of Xenopus laevis using dynamic ToF-SIMS imaging

Journal of Lipid Research, 2014
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging has been used for the direct analysis of single intact Xenopus laevis embryo surfaces, locating multiple lipids during fertilization and the early embryo development stages with ...
Hua Tian, John S. Fletcher, Raphael Thuret, Alex Henderson, Nancy Papalopulu, John C. Vickerman, Nicholas P. Lockyer   +6 more
doaj   +1 more source

Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging [PDF]

, 2013
RATIONALE: Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high-speed imaging of biomolecules from complex surfaces.
Jungmann, JH, Kiss, A., Heeren, R.M.A., Afd Scheikunde Algemeen, Smith, D.F., Sub Biomol.Mass Spectrometry & Proteom., Biomolecular Mass Spectrometry and Proteomics   +6 more
core   +1 more source

Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry [PDF]

, 2014
This study thoroughly explores the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fingermarks and ink on a porous paper surface.
de Puit, Marcel, Jones, Benjamin, Ismail, Mahado, Reynolds, Alan, Ismail, M, Jones, BJ, Doodkorte, Lisette, Attard-Montalto, N, Ojeda, Jesus J., Doodkorte, L, Bailey, Melanie, Reynolds, A, Jesus Ojeda Ledo, Bailey, M, De Puit, M, Jones, B J, Attard-Montalto, Nicola, Ojeda, JJ, Ojeda, J J   +18 more
core   +1 more source

Machine-learning-enhanced time-of-flight mass spectrometry analysis

Patterns, 2021
Summary: Mass spectrometry is a widespread approach used to work out what the constituents of a material are. Atoms and molecules are removed from the material and collected, and subsequently, a critical step is to infer their correct identities based on
Ye Wei, Rama Srinivas Varanasi, Torsten Schwarz, Leonie Gomell, Huan Zhao, David J. Larson, Binhan Sun, Geng Liu, Hao Chen, Dierk Raabe, Baptiste Gault   +10 more
doaj   +1 more source