Secondary ion mass spectrometry imaging of Dictyostelium discoideum aggregation streams. [PDF]
PLoS ONE, 2014 High resolution imaging mass spectrometry could become a valuable tool for cell and developmental biology, but both, high spatial and mass spectral resolution are needed to enable this.
John Daniel DeBord +6 more
doaj +8 more sources
ToF-SIMS evaluation of PEG-related mass peaks and applications in PEG detection in cosmetic products [PDF]
Scientific ReportsPolyethylene glycols (PEGs) are used in industrial, medical, health care, and personal care applications. The cycling and disposal of synthetic polymers like PEGs pose significant environmental concerns.
Yanjie Shen, Jiyoung Son, Xiao-Ying Yu
doaj +2 more sources
Characterization of the Micro‐Morphology and Compositional Distribution of Chang'e‐5 Lunar Soil Mineral Surfaces Using TOF‐SIMS [PDF]
Advanced ScienceThe lunar soil samples returned by China's Chang'e‐5 (CE‐5) contain valuable information on geological evolutions on the Moon. Herein, by employing high‐resolution time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS), five rock chip samples from the
Tinglu Song +10 more
doaj +2 more sources
Quantitative Study of Spodumene by Time-of-Flight Secondary Ion Mass Spectrometry (tof-SIMS) [PDF]
MoleculesIn this paper, the quantitative feasibility of time-of-flight secondary ion mass spectrometry (tof-SIMS) for major and minor elements in spodumene was evaluated in terms of calibration method with a matrix-matched or non-matrix-matched standard and an ...
Xijuan Tan
doaj +2 more sources
Spectroscopy in the analysis of bacterial and eukaryotic cell footprints on implant surfaces [PDF]
European Cells & Materials, 2012 We tested the suitability of two spectroscopic methods, x-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), in the recognition of bacterial and eukaryotic cell footprints on implant surfaces.
E Kaivosoja +4 more
doaj +3 more sources
ToF-SIMS : methods & applications [PDF]
, 2022 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.
Prakash, Aruna +3 more
openaire +1 more source
TOF-SIMS: Accurate mass scale calibration [PDF]
Journal of the American Society for Mass Spectrometry, 2006 A study is presented of the factors affecting the calibration of the mass scale in time-of-flight secondary ion mass spectrometry (TOF-SIMS). At the present time, TOF-SIMS analysts using local calibration procedures achieve a rather poor relative mass accuracy of only 150 ppm for large molecules (647 u) whereas for smaller fragments of
Green, F.M., Gilmore, I.S., Seah, M.P.
openaire +2 more sources
Frontiers in Chemistry, 2023 Detection of per- and polyfluoroalkyl substances (PFASs) is crucial in environmental mitigation and remediation of these persistent pollutants. We demonstrate that time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a viable technique to analyze
Xiao-Ying Yu +7 more
doaj +1 more source
PIXE and ToF-SIMS analysis of streaker samplers filters [PDF]
, 2004 This paper presents methodological innovations introduced in the characterisation of urban aerosol collected in Italy in a recent campaign. Two complementary ion beam analysis (IBA) techniques were used to analyse Nuclepore filters used in continuous ...
Adriaens, Mieke +9 more
core +2 more sources
Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): application to pharmaceutical materials [PDF]
, 2016 The structure of a material, in particular the extremes of crystalline and amorphous forms, significantly impacts material performance in numerous sectors such as semiconductors, energy storage, and pharmaceutical products, which are investigated in this
Alexander, Morgan R. +5 more
core +3 more sources