Results 71 to 80 of about 16,582,220 (297)

Tumour–host interactions in Drosophila: mechanisms in the tumour micro‐ and macroenvironment

open access: yesMolecular Oncology, EarlyView.
This review examines how tumour–host crosstalk takes place at multiple levels of biological organisation, from local cell competition and immune crosstalk to organism‐wide metabolic and physiological collapse. Here, we integrate findings from Drosophila melanogaster studies that reveal conserved mechanisms through which tumours hijack host systems to ...
José Teles‐Reis, Tor Erik Rusten
wiley   +1 more source

Loss of IGF‐1R impairs DNA‐PKcs recruitment to chromatin leading to defective end‐joining

open access: yesMolecular Oncology, EarlyView.
IGF‐1R promotes radioresistance by facilitating DNA‐PKcs recruitment to chromatin, enabling non‐homologous end‐joining (NHEJ) repair of double‐strand breaks. Inhibition or loss of IGF‐1R disrupts this recruitment to damage sites, driving compensatory reliance on microhomology‐mediated end‐joining (MMEJ) repair.
Matthew O. Ellis   +3 more
wiley   +1 more source

The effect of low dose ionizing radiation exposure on dynamic thiol-disulfide homeostasis and ischemia modified albumin levels: an observational study [PDF]

open access: yesRevista Brasileira de Anestesiologia
Background: The primary objective of this study was to investigate the effect of low dose ionizing radiation exposure on thiol/disulfide homeostasis and ischemia modified albumin levels.
Sule Arıcan   +7 more
doaj   +3 more sources

PAK1 activation drives divergent resistance mechanisms to aromatase inhibition and tamoxifen in a luminal: A breast cancer model

open access: yesMolecular Oncology, EarlyView.
Breast cancer remains a major cause of cancer death in women, frequently developing endocrine therapy resistance. This study demonstrates that upregulated p21‐activated kinase 1 (PAK1) activity drives resistance to tamoxifen and long‐term estrogen deprivation in ER+ breast cancer models.
Luisa Schwarzmüller   +10 more
wiley   +1 more source

Study on Total Ionizing Dose Effect of Three-dimensional Microsystem Interconnection Structure Based on Through-silicon Via

open access: yesYuanzineng kexue jishu
With the development of Moore’s law, through-silicon via (TSV) has emerged as a critical technology for the realization of three-dimensional (3-D) integrated microsystem.
WANG Hao1, 2, , CHEN Rui1, 2, , CHEN Qian1, HAN Jianwei1, 2, YU Xin3, MENG Dechao4, YANG Jiapeng5, XUE Yuxiong6, ZHOU Quanfeng4, HAN Ruilong1, 2
doaj   +1 more source

Effects of Total Ionizing Dose on Bipolar Junction Transistor [PDF]

open access: yesAmerican Journal of Applied Sciences, 2010
Problem statement: The amount of ionizing radiation that Bipolar Junction Transistor (BJT) devices encounter during their lifecycle degrades both of their functional and electrical parameter performances. The different radiation environments either in space, high energy physics experiments, nuclear environment or fabrication process as well as for ...
openaire   +1 more source

Total Ionizing Dose Test Report for the MB85AS4MT ReRAM [PDF]

open access: yes, 2017
This is a Total Ionizing Dose (TID) test report for the Fujitsu Semiconductor MB85AS4MT Resistive Random Access Memory (ReRAM)
LaBel, Kenneth   +2 more
core  

Profiling neoadjuvant therapy response in rectal cancer using meta‐analysis of publicly available transcriptomic RNA‐seq datasets

open access: yesMolecular Oncology, EarlyView.
This study integrates publicly available transcriptomic datasets to identify molecular signatures associated with response to neoadjuvant chemoradiotherapy in locally advanced rectal cancer. By analyzing a combination of multiple cohorts with bioinformatics approaches, we reveal biological pathways and immune‐related features that may improve ...
Aleksandra Stanojevic   +10 more
wiley   +1 more source

A study on effects of total ionizing dose on hot carrier effect of PD I/O SOI PMOSFETs

open access: yesResults in Physics, 2019
The hot carrier injection (HCI) effect induced degradation is investigated for gamma ray irradiated PD I/O SOI PMOSFETs with T-shaped gate and H-shaped gate.
Jinghao Zhao   +6 more
doaj   +1 more source

Total Ionizing Dose (TID) effects on finger transistors in a 65nm CMOS process

open access: yes, 2016
Although Total Ionizing Dose (TID) effects are generally unpronounced in deep-submicron-CMOS, we show the TID-induced leakage current @TID=500Krad is significant in NMOS-finger-transistors of GlobalFoundries 65nm CMOS.
Lin, Tong   +13 more
core   +1 more source

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