Results 141 to 150 of about 11,441 (198)
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Jitter-Based Reconstruction Of Transmission Line Pulse Using On-Chip Sensor
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021A technique for reconstruction of on-chip high frequency signals is demonstrated. The majority of the on-chip reconstruction methods based on subsampling technique are applicable to synchronized systems. This paper demonstrates a jitter-based subsampling
Bhuvnesh Narayanan +3 more
semanticscholar +1 more source
Transient analysis of latent damage formation in SMD capacitors by Transmission Line Pulsing (TLP)
Microelectronics Reliability, 2017Abstract Latent defects were provoked in SMD capacitors by short TLP current pulses. Simultaneously the transient evolution of the device's charge was extracted to generate its Q(V) characteristics and to determine its capacitive behaviour during the transient current stress.
D. Helmut, G. Wachutka, G. Groos
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2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672), 2004
ESD robustness of Low Temperature Poly-Si (LTPS) diodes and TFT devices has been investigated in this paper. By using the Transmission Line Pulsing (TLP) techniques, the It2 (secondary breakdown current) of LTPS diodes and TFT devices were measured. To evaluate the ESD robustness of components for ESD protection, the shifts of breakdown voltage and cut-
null Ming-Dou Ker +4 more
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ESD robustness of Low Temperature Poly-Si (LTPS) diodes and TFT devices has been investigated in this paper. By using the Transmission Line Pulsing (TLP) techniques, the It2 (secondary breakdown current) of LTPS diodes and TFT devices were measured. To evaluate the ESD robustness of components for ESD protection, the shifts of breakdown voltage and cut-
null Ming-Dou Ker +4 more
openaire +1 more source
IEEE Transactions on Electron Devices, 2020
This work proposes a new method to estimate the correlation between human body model (HBM) and transmission line pulse (TLP) based on RC thermal equivalent model to obtain the normalized critical temperature.
Yize Wang, Yuan Wang
semanticscholar +1 more source
This work proposes a new method to estimate the correlation between human body model (HBM) and transmission line pulse (TLP) based on RC thermal equivalent model to obtain the normalized critical temperature.
Yize Wang, Yuan Wang
semanticscholar +1 more source
Microelectronics Reliability, 2011
Abstract We present a new method for the on-wafer-characterisation for the reverse recovery behaviour of integrated diodes, which can perform on-wafer automated measurements over a wide range of different bias and pulsing conditions. The system is based on a Transmission-Line-Pulsing (TLP) technique and can be used to characterise diodes down to the
Martin Sauter +3 more
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Abstract We present a new method for the on-wafer-characterisation for the reverse recovery behaviour of integrated diodes, which can perform on-wafer automated measurements over a wide range of different bias and pulsing conditions. The system is based on a Transmission-Line-Pulsing (TLP) technique and can be used to characterise diodes down to the
Martin Sauter +3 more
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Microelectronics Reliability, 2005
This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests.
Heinrich Wolf +3 more
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This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests.
Heinrich Wolf +3 more
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ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153), 2002
Transmission line pulsing (TLP) is a useful technique to characterize electrostatic discharge (ESD) events in semiconductor devices. The pulse waveforms generated by a typical TLP set-up, however, are often distorted and oscillatory. In this paper, a new and simple experimental set-up is developed to improve the shape of the TLP waveforms and thus to ...
J.C. Lee +4 more
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Transmission line pulsing (TLP) is a useful technique to characterize electrostatic discharge (ESD) events in semiconductor devices. The pulse waveforms generated by a typical TLP set-up, however, are often distorted and oscillatory. In this paper, a new and simple experimental set-up is developed to improve the shape of the TLP waveforms and thus to ...
J.C. Lee +4 more
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IEEE Electron Device Letters, 2008
Latch-up is one of the most critical issues in high-voltage (HV) ICs due to the high power-supply voltages. Because the breakdown junction of an HV device is easily damaged by the huge power generated from a DC curve tracer, the device immunity against latch-up is often referred to the transmission-line-pulsing (TLP)-measured holding voltage.
Wen-Yi Chen, Ming-Dou Ker, Yeh-Jen Huang
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Latch-up is one of the most critical issues in high-voltage (HV) ICs due to the high power-supply voltages. Because the breakdown junction of an HV device is easily damaged by the huge power generated from a DC curve tracer, the device immunity against latch-up is often referred to the transmission-line-pulsing (TLP)-measured holding voltage.
Wen-Yi Chen, Ming-Dou Ker, Yeh-Jen Huang
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Investigation on ESD Robustness of 20-V GGNMOS and GDPMOS in 4H-SiC Process with 100-ns TLP Pulse
IEEE Workshop on Wide Bandgap Power Devices and Applications, 2023The ESD robustness of 20-V GGNMOS and GDPMOS fabricated by the 4H-SiC process was investigated by the 100-ns transmission-line-pulse (TLP) pulse. The experimental results show that, under the test of breakdown mode, there is no correlation between the ...
Chao-Yang Ke, M. Ker
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2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2017
For the first time this correlation study compares air discharge CDM and contact-mode Capacitively Coupled Transmission Line Pulsing (CC-TLP) for a large chip-on-flex assembly e.g. for the Internet of Things (IOT) applications. Both ground planes overlap only part of the flexible substrate with long traces.
Johannes Weber +4 more
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For the first time this correlation study compares air discharge CDM and contact-mode Capacitively Coupled Transmission Line Pulsing (CC-TLP) for a large chip-on-flex assembly e.g. for the Internet of Things (IOT) applications. Both ground planes overlap only part of the flexible substrate with long traces.
Johannes Weber +4 more
openaire +1 more source