Results 131 to 140 of about 5,995,120 (145)
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ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool?

IEEE Transactions on Instrumentation and Measurement, 2009
Guido Groeseneken   +2 more
exaly  

Correlation Between TLP, HMM, and System-Level ESD Pulses for Cu Metallization

IEEE Transactions on Device and Materials Reliability, 2014
J Liou
exaly  

TLP calibration, correlation, standards, and new techniques

IEEE Transactions on Electronics Packaging Manufacturing, 2001
exaly  

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