Results 111 to 120 of about 5,995,120 (145)

Low cost industrial production of coagulation factor IX bioencapsulated in lettuce cells for oral tolerance induction in hemophilia B. [PDF]

Biomaterials, 2015
Su J, Zhu L, Sherman A, Wang X, Lin S, Kamesh A, Norikane JH, Streatfield SJ, Herzog RW, Daniell H.   +9 more
europepmc   +1 more source

Influence of albumin concentration on surface characteristics and cellular responses in the pre-incubation of multi-walled carbon nanotubes. [PDF]

Nanoscale Adv
Lee SY, Choi JW, Lee TG, Heo MB, Son JG.
europepmc   +1 more source

Defense responses of lentil (Lens culinaris) genotypes carrying non-allelic ascochyta blight resistance genes to Ascochyta lentis infection. [PDF]

PLoS One, 2018
Sari E, Bhadauria V, Ramsay L, Borhan MH, Lichtenzveig J, Bett KE, Vandenberg A, Banniza S.   +7 more
europepmc   +1 more source

Capacitively coupled transmission line pulsing cc-TLP––a traceable and reproducible stress method in the CDM-domain

Microelectronics Reliability, 2005
This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests.
Heinrich Wolf, Horst A. Gieser, Wolfgang Stadler, Wolfgang Wilkening   +3 more
openaire   +3 more sources

Some of the next articles are maybe not open access.

Related searches:

Debug and prediction of EOS events using long duration Transmission Line Pulse (TLP) measurements

2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015
This case study demonstrates how long-duration Transmission Line Pulse (TLP) measurements can be used to debug, replicate and even predict EOS events. Knowing the EOS waveform characteristics allows easier determination of the root cause of the electrical overstress. This is critical in preventing future such occurrences.
Dave Clarke, Stephen Heffernan
openaire   +3 more sources

ESD evaluation of a low voltage triggering SCR (LVTSCR) device submitted to transmission line pulse (TLP) test

Journal of Electrostatics, 2002
Abstract For a deeper understanding of protection structures during ESD events, transmission line pulse events are applied and simulated with a two-dimensional (2D) device simulator on the particular case of a 1.2 μm low voltage triggering silicon controlled rectifier.
Guilhaume, A., Galy, P., Chante, Jean-Pierre, Foucher, B., Bardy, S., Blanc, F.   +5 more
openaire   +4 more sources

Transmission line pulse (TLP) testing of radio frequency (RF) micro-machined micro-electromechanical systems (MEMS) switches

, 2006
Radio frequency micro-electromechanical (RF-MEM) switches, both ohmic and capacitive, are important for future RF wired and wireless communication systems. In this paper, transmission line pulse testing and ESD characterization is shown for the first time.
TAZZOLI, AUGUSTO, PERETTI, VANNI, ZANONI, ENRICO, MENEGHESSO, GAUDENZIO   +3 more
openaire   +2 more sources

Sensor Gap TLP: Expanding Time Resolution and Pulse Duration Beyond Conventional Values of Standard and Very Fast Transmission Line Pulsing

2023 45th Annual EOS/ESD Symposium (EOS/ESD), 2023
Dennis Helmut, Gerhard Groos
openaire   +3 more sources

Fine Modeling of Transmission Line Pulse (TLP) and Exploitation for Measurement Set-Up Optimization

9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010, 2010
Lafon, F., Daran, F., Rigour, S., Lagrange, J., Ramdani, Mohamed, Drissi, M'Hamed   +5 more
openaire   +4 more sources

Estimation of Oxide Breakdown Voltage During a CDM Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements

, 2021
International audienceUsing TLP (Transmission Line Pulse) and VF-TLP (Very Fast Transmission Line Pulse) to emulate a fast transient stress, a study of oxide reliability during a CDM (Charged Devise Model) event was done to establish an empirical law ...
Emmanuel Simeu, Jean-Daniel Arnould
exaly   +2 more sources