Results 101 to 110 of about 182 (116)
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Correlation Between TLP, HMM, and System-Level ESD Pulses for Cu Metallization

IEEE Transactions on Device and Materials Reliability, 2014
J Liou
exaly  

ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool?

IEEE Transactions on Instrumentation and Measurement, 2009
Guido Groeseneken   +2 more
exaly  

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