Results 81 to 90 of about 182 (116)

Structural correlates of rotavirus cell entry. [PDF]

PLoS Pathog, 2014
Abdelhakim AH, Salgado EN, Fu X, Pasham M, Nicastro D, Kirchhausen T, Harrison SC.   +6 more
europepmc   +1 more source

Low cost industrial production of coagulation factor IX bioencapsulated in lettuce cells for oral tolerance induction in hemophilia B. [PDF]

Biomaterials, 2015
Su J, Zhu L, Sherman A, Wang X, Lin S, Kamesh A, Norikane JH, Streatfield SJ, Herzog RW, Daniell H.   +9 more
europepmc   +1 more source

Influence of albumin concentration on surface characteristics and cellular responses in the pre-incubation of multi-walled carbon nanotubes. [PDF]

Nanoscale Adv
Lee SY, Choi JW, Lee TG, Heo MB, Son JG.
europepmc   +1 more source

Defense responses of lentil (Lens culinaris) genotypes carrying non-allelic ascochyta blight resistance genes to Ascochyta lentis infection. [PDF]

PLoS One, 2018
Sari E, Bhadauria V, Ramsay L, Borhan MH, Lichtenzveig J, Bett KE, Vandenberg A, Banniza S.   +7 more
europepmc   +1 more source

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Debug and prediction of EOS events using long duration Transmission Line Pulse (TLP) measurements

2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015
This case study demonstrates how long-duration Transmission Line Pulse (TLP) measurements can be used to debug, replicate and even predict EOS events. Knowing the EOS waveform characteristics allows easier determination of the root cause of the electrical overstress. This is critical in preventing future such occurrences.
Dave Clarke, Stephen Heffernan
openaire   +3 more sources

ESD evaluation of a low voltage triggering SCR (LVTSCR) device submitted to transmission line pulse (TLP) test

Journal of Electrostatics, 2002
Abstract For a deeper understanding of protection structures during ESD events, transmission line pulse events are applied and simulated with a two-dimensional (2D) device simulator on the particular case of a 1.2 μm low voltage triggering silicon controlled rectifier.
Guilhaume, A., Galy, P., Chante, Jean-Pierre, Foucher, B., Bardy, S., Blanc, F.   +5 more
openaire   +4 more sources

Sensor Gap TLP: Expanding Time Resolution and Pulse Duration Beyond Conventional Values of Standard and Very Fast Transmission Line Pulsing

2023 45th Annual EOS/ESD Symposium (EOS/ESD), 2023
Dennis Helmut, Gerhard Groos
openaire   +3 more sources

Fine Modeling of Transmission Line Pulse (TLP) and Exploitation for Measurement Set-Up Optimization

9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010, 2010
Lafon, F., Daran, F., Rigour, S., Lagrange, J., Ramdani, Mohamed, Drissi, M'Hamed   +5 more
openaire   +4 more sources

On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP)

Microelectronics Reliability, 2011
Abstract We present a new method for the on-wafer-characterisation for the reverse recovery behaviour of integrated diodes, which can perform on-wafer automated measurements over a wide range of different bias and pulsing conditions. The system is based on a Transmission-Line-Pulsing (TLP) technique and can be used to characterise diodes down to the
Martin Sauter, Werner Simbürger, David Johnsson, Matthias Stecher   +3 more
openaire   +1 more source

Transient analysis of latent damage formation in SMD capacitors by Transmission Line Pulsing (TLP)

Microelectronics Reliability, 2017
Abstract Latent defects were provoked in SMD capacitors by short TLP current pulses. Simultaneously the transient evolution of the device's charge was extracted to generate its Q(V) characteristics and to determine its capacitive behaviour during the transient current stress.
Dennis Helmut, Gerhard K. M. Wachutka, Gerhard Groos   +2 more
openaire   +1 more source