Results 61 to 70 of about 5,995,120 (145)

Experimental Investigation of the Transmission Efficiency of In-line Low Pulse Pulsing CVT

open access: yes, 2015
An experimental prototype of in- line,low pulse pulsing continuously variable transmission( CVT) is designed and manufactured,its basic structure and working principle are introduced in detail.
Liu Kaichang, Zheng Zongxi
core   +1 more source

Numerical investigation for a Grounded Gate NMOS Transistor under electrostatic discharge (ESD) through TLP method

open access: yes, 2000
International audienceFor many years,design of robust ESD cell becomes critical due to the ever increasing density of technology process. This paper presents the main results of a numerical investigation of a Grounded Gate NMOS Transistor (GGNMOST) under
Galy, P.   +7 more
core   +4 more sources

Ion trap and release dynamics enables nonintrusive tactile augmentation in monolithic sensory neuron. [PDF]

open access: yesSci Adv, 2023
Kweon H   +10 more
europepmc   +1 more source

Publication Only

open access: yes
HemaSphere, Volume 9, Issue S1, June 2025.
wiley   +1 more source

A Novel Bidirectional AlGaN/GaN ESD Protection Diode. [PDF]

open access: yesMicromachines (Basel), 2022
Yao B   +11 more
europepmc   +1 more source

WEST Associates Transmission Line

open access: yes, 2006
Document: "WEST Associates transmission line map",1966 ...
Western Energy Supply and Transmission (WEST) Associates (?)
core   +2 more sources

Development of a measurement for technology learning process (TLP) [PDF]

open access: yes, 2008
Advanced Manufacturing Technologies (AMTs) are widely used by manufacturing organisations all over the world. Unfortunately, the process of implementation of AMT projects has been unsatisfactory and sometimes led to total failure.
Dabnoon, Mohammed
core   +1 more source

TLP-vfTLP Testing for ESD Models [PDF]

open access: yes
Electrostatic Discharge (ESD) protection is critical for ensuring the reliability and longevity of electronic components. The RC clamp, consisting of a resistor (R) and a capacitor (C), is a widely used circuit for mitigating the effects of ESD events.
Choudhary, Rohit
core  

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