Results 61 to 70 of about 322 (148)

The impact of process optimisation on planar THz-Schottky device reliability [PDF]

, 2004
The technological complexity as well as space-application quality standards require sophisticated process control and optimization for reliability improvement of planar THz-Schottky devices.
HARTNAGEL, H. L., Sydlo, Cezary, Cojocari, Oleg, MOTTET, B., Robillard, Q. de, Hartnagel, Hans L., Mottet, Bastian, ROBILLARD DE, Q., COJOCARI, O., Kögel, Benjamin, SYDLO, C., KOGEL, B.   +11 more
core   +1 more source

Method For Determining A Transmission Line Pulse Shape That Produces Equivalent Results To Human Body Model Testing Methods

, 2000
Electrostatic discharge (ESD) is responsible for more than 25% of semiconductor device and chip damage each year. This paper focuses on an ESD event resulting from the charge being transferred from a human body to an integrated circuit (i.e., called the ...
Croft, G. D., Hoque, M. A., Lee, J. C.
core  

Investigation Of Turn-On Speeds Of Electrostatic Discharge Protection Devices Using Transmission-Line Pulsing Technique

, 2008
As process technologies advance into deep sub-micrometer and nanometer scale, the charged device model (CDM) is now considered an important stress model for defining electrostatic discharge (ESD) reliability of integrated circuits.
Ding, K. B., Dong, S. R., Liou, J. J., Han, Y., Huo, M. X.   +4 more
core   +1 more source

MOSs-String-Triggered Silicon-Controlled Rectifier (MTSCR) ESD Protection Device for 1.8 V Application. [PDF]

Micromachines (Basel), 2023
Chen R, Wei H, Liu H, Hou F, Xiang Q, Du F, Yan C, Gao T, Liu Z.   +8 more
europepmc   +1 more source

Graphene-Based ESD Protection for Future ICs. [PDF]

Nanomaterials (Basel), 2023
Li C, Pan Z, Hao W, Li X, Miao R, Wang A.   +5 more
europepmc   +1 more source

Ion trap and release dynamics enables nonintrusive tactile augmentation in monolithic sensory neuron. [PDF]

Sci Adv, 2023
Kweon H, Kim JS, Kim S, Kang H, Kim DJ, Choi H, Roe DG, Choi YJ, Lee SG, Cho JH, Kim DH.   +10 more
europepmc   +1 more source

Publication Only

HemaSphere, Volume 9, Issue S1, June 2025.
wiley   +1 more source

Ultra-Low-Voltage-Triggered Silicon Controlled Rectifier ESD Protection Device for 2.5 V Nano Integrated Circuit. [PDF]

Nanomaterials (Basel), 2022
Chen R, Wei H, Liu H, Liu Z, Chen Y.
europepmc   +1 more source

Zuverlässigkeitsstudien an Höchstfrequenzbauelementen mit gepulsten Techniken (TLP-Methode)

, 2004
Diese Arbeit beschreibt die gezielte Anregung zuverlässigkeitsrelevanter Degradations- und Defektmechanismen bei III/V Höchstfrequenzbauelementen (InGaP/GaAs Heterostruktur Bipolartransistor, Pt/GaAs THz-Schottkydiode) unter Verwendung elektrischer Pulse
Mottet, Bastian
core  

Systematic Transient Characterization of Graphene Interconnects for on-Chip ESD Protection

, 2016
Both novel ESD structures and robust ESD interconnects are critical to on-chip ESD protection designs [1-3], which are characterized by transient transmission line pulse (TLP) testing for human body model (HBM).
Cheng, Yuhua, Rui Ma, Wei Zhang, Liu, Ming, Wang, Albert, Xia, Ming, Zhang, Wei, Chen, Qi, Albert Wang, Fei Lu, Chenkun Wang, Ya-Hong Xie, Xie, Ya-Hong, Yuhua Cheng, Lu, Fei, Wang, Chenkun, Ming Liu, Ming Xia, Qi Chen, Ma, Rui   +19 more
core   +1 more source