Results 51 to 60 of about 322 (148)

Short‐term storage of sperm in common carp from laboratory research to commercial production—A review

Reviews in Aquaculture, Volume 16, Issue 1, Page 174-189, January 2024.
Abstract Short‐term storage of fish sperm is a simple and cost‐effective process in fishery research from basic to applied perspectives. It has been used to elucidate and evaluate gamete biology and quality, perform in vitro fertilization, develop sperm cryopreservation.
Nururshopa Eskander Shazada, Sayyed Mohammad Hadi Alavi, Mohammad Abdul Momin Siddique, Yu Cheng, Songpei Zhang, Marek Rodina, Martin Kocour, Otomar Linhart   +7 more
wiley   +1 more source

Fully Integrated GaN-on-Silicon Power-Rail ESD Clamp Circuit Without Transient Leakage Current During Normal Power-on Operation

IEEE Journal of the Electron Devices Society
When more circuit functions are integrated into a single chip fabricated by the GaN-on-Silicon process, the need for on-chip electrostatic discharge (ESD) protection design becomes crucial to safeguard GaN integrated circuits (ICs).
Wei-Cheng Wang, Ming-Dou Ker
doaj   +1 more source

A novel TLP-based method to deliver IEC 61000-4-2 ESD stress

, 2017
The electro-static discharging (ESD) gun test method is widely used and admitted for systems, but it will also bring some unwished factors to influence the accuracy and stability such as radiated electromagnetic ( EM) and the unstable hand-held ...
Jian Cao, Lu, Guangyi, Zhang, Xing, Xing Zhang, Wang, Yuan, Wang, Yize, Cao, Jian, Yize Wang, Yuan Wang, Guangyi Lu   +9 more
core   +1 more source

Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model from TLP Measurements

, 2022
International audienceIn order to ensure reliability of systems early in the design phase, it is becoming crucial to have models able to predict the behavior of systems exposed to ElectroStatic Discharge (ESD).
Escudié, Fabien, Nolhier, Nicolas, Caignet, Fabrice, Boyer, Alexandre   +3 more
core   +1 more source

Transmission line pulsing behavior of thin film resistors

, 2022
S.165-170One of the most important issues of resistor properties is the value stability under different electrical and non electrical influences. Mechanical or thermal stress together with the electrical one represents the main factors that have a major ...
Gieser, H., Bonfert, D., Svasta, P., Klink, G., Wolf, H.   +4 more
core  

A comparison study on ESD device between Human Body Model(HBM)and Transmission Line Pulse (TLP)

, 2010
[[abstract]]Motivation of this research study is to compare the Electro Static Discharge (ESD) characteristics of Human Body Model (HBM) and Transmission Line Pulse (TLP) and their superiority over others.
Batzorig Lombodorj
core  

A Novel Insight into Transient Behaviors of Diode-Triggered SCRs under VF-TLP Testing by 2D/3D Simulations

, 2016
Transient behaviors of the diode-triggered silicon controlled rectifiers (DTSCRs) under very-fast transmission line pulse (VF-TLP) testing are investigated in this paper.
Zhang, Lizhong, Wang, Yuan, He, Yandong, Yuan Wang, Lizhong Zhang, Yandong He   +5 more
core   +1 more source

Systematic Characterization of Graphene ESD Interconnects for On-Chip ESD Protection [PDF]

, 2016
We report systematic transient characterization of a graphene ribbon (GR) used as an interconnect for electrostatic discharge (ESD) protection of future integrated circuits. A large set of GR wires (around 6000) with varying and practical dimensions were
Xie, Ya-Hong, Lu, Fei, Liang, Owen, Wang, Chenkun, Li, Cheng, Zhang, Feilong, Tang, He, Wang, Albert, Zhang, Wei, Chen, Qi, Ma, Rui   +10 more
core   +1 more source

System Level ESD Testing with Capacitively Coupled Stress Pulses

, 2022
2026A debugging test method is presented which helps to identify susceptible pins which failed after system level ESD testing in compliance with IEC 61000-4-2.
Gieser, Horst, Weber, Johannes, Jirutková, Ellen, Wolf, Heinrich   +3 more
core   +1 more source

Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations

, 2019
4 S.Electrostatic discharge (ESD) can be considered as one of the main reliability risks for modern electronic systems which causes failure of semiconductor devices by an over current effect.
Scharf, Patrick, Sohrmann, Christoph, Beyer, Volkhard, Holland, Steffen   +3 more
core   +1 more source