Results 151 to 160 of about 11,441 (198)

Physical Model for ESD Human Body Model to Transmission Line Pulse

IEEE International Reliability Physics Symposium, 2019
A rigorous electrothermal model that describes and correlate the behavior of the ESD devices during TLP and HBM stress conditions for various device types is developed, nearly five decades after well-known Wunsch-Bell and Tasca models.
Jian-Hsing Lee, N. M. Iyer, T. Maloney
semanticscholar   +1 more source

An Improved Backpropagation Neural Network Method for Characterizing Performance Degradation of LDMOS Device Under Transmission Line Pulse Interference

IEEE transactions on device and materials reliability
With the wide applications of Lateral Diffused Metal-Oxide-Semiconductor (LDMOS) transistors in power conversion systems, their reliability has become a growing concern.
Dongyan Zhao, Zhengwei Du, Qi-Chao Wang, Kai-Yi Yang, Hao Xie, Fang Liu, Yaxing Zhu, Yingzong Liang, Wen-Yan Yin   +8 more
semanticscholar   +1 more source

Transient Response of Very Fast Transmission Line Pulse: Procedures for Measurement Verification

Electrical Overstress/Electrostatic Discharge Symposium
An important cause of inaccuracies in time dependent VF-TLP measurements of transient events are parasitic inductances/capacitances built into the test setup itself. In this paper it is discussed how to provide confidence of an accurate representation of
Leonardo Di Biccari, Robert Ashton, Theo Smedes, A. Boroni, K. Muhonen, Wei Huang, Henning Lohmeyer, Mirko Scholz, Tom Meuse   +8 more
semanticscholar   +1 more source

Evolution of Point Defects in Chip-Level Silicon-Based MOSFET Under Transmission Line Pulse Stress

IEEE Transactions on Electron Devices
In this study, the electrical performance and evolution of point defects in chip-level Silicon-based MOSFET under transmission line pulse (TLP) stress were investigated.
Xinyuan Zheng, Huiying Li, Yibo Ning, Chengbing Pan, Kai Wang, Lixia Zhao   +5 more
semanticscholar   +1 more source

Characterization of Surge Suppression Devices in a Single Non-Destructive Measurement Process Using a Pulse Transmission Line Tester

IEEE Biennial Congress of Argentina
A non-destructive testing method is described to evaluate in a single measurement process two parameters of protection devices against surge transient (SPD): the parasitic capacitance and the protection voltage.
J. G. Zola, Juan Miguel Kelly
semanticscholar   +1 more source

Transmission line pulse (TLP) testing of radio frequency (RF) micro-machined micro-electromechanical systems (MEMS) switches

2006
Radio frequency micro-electromechanical (RF-MEM) switches, both ohmic and capacitive, are important for future RF wired and wireless communication systems. In this paper, transmission line pulse testing and ESD characterization is shown for the first time.
TAZZOLI, AUGUSTO, PERETTI, VANNI, ZANONI, ENRICO, MENEGHESSO, GAUDENZIO   +3 more
openaire   +1 more source

Transmission Line Pulse (TLP) Testing

, 2016
S. Voldman
semanticscholar   +1 more source

Transmission Line Pulse Test Method for Estimating SEB Performance of $n$ -Channel Lateral DMOS Power Transistors

IEEE Transactions on Nuclear Science, 2018
M. Hamlyn, P. Hower, K. Warren, R. Baumann   +3 more
semanticscholar   +1 more source

Immunotherapies for hepatocellular carcinoma

Nature Reviews Clinical Oncology, 2021
, Florian Castet, Mala K Maini
exaly  

Electrostatic test structures for transmission line pulse and human body model testing at wafer level

International Conference on Microelectronic Test Structures, 2018
R. Ashton, Stephen Fairbanks, Adam Bergen, E. Grund   +3 more
semanticscholar   +1 more source