Results 71 to 80 of about 62,163 (82)
Some of the next articles are maybe not open access.
High aspect ratio copper through-silicon-vias for 3D integration
Microelectronic Engineering, 2008Zheyao Wang, Jian Cai, Qianwen Chen
exaly
Electromigration reliability of tungsten and aluminum vias and improvements under AC current stress
IEEE Transactions on Electron Devices, 1993N W Cheung
exaly
Novel Photo-Defined Polymer-Enhanced Through-Silicon Vias for Silicon Interposers
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2013Paragkumar Thadesar
exaly
Reliability challenges for barrier/liner system in high aspect ratio through silicon vias
Microelectronics Reliability, 2014Eric Beyne +2 more
exaly
Electromigration Study for Multiscale Power/Ground Vias in TSV-Based 3-D ICs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2014David Z Pan, Sung Kyu Lim
exaly
Signal Integrity Analysis Between Continuous Vias and Indirect Vias on RDL Circuits
Sung-Mao Wuexaly

